{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T09:55:19Z","timestamp":1725443719803},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,3]]},"DOI":"10.1109\/isqed.2009.4810366","type":"proceedings-article","created":{"date-parts":[[2009,4,3]],"date-time":"2009-04-03T18:50:11Z","timestamp":1238784611000},"page":"622-626","source":"Crossref","is-referenced-by-count":1,"title":["Increasing memory yield in future technologies through innovative design"],"prefix":"10.1109","author":[{"given":"Costas","family":"Argyrides","sequence":"first","affiliation":[]},{"given":"Ahmad","family":"Al-Yamani","sequence":"additional","affiliation":[]},{"given":"Carlos","family":"Lisboa","sequence":"additional","affiliation":[]},{"given":"Luigi","family":"Carro","sequence":"additional","affiliation":[]},{"given":"Dhiraj","family":"Pradhan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805645"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.47"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.39"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863189"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/4.65704"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/43.46807"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743312"},{"key":"9","first-page":"175","article-title":"defect analysis system speeds test and repair of redundant memories","author":"tarr","year":"1984","journal-title":"Electronics"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2004.1327985"}],"event":{"name":"2009 10th International Symposium on Quality of Electronic Design (ISQED)","start":{"date-parts":[[2009,3,16]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2009,3,18]]}},"container-title":["2009 10th International Symposium on Quality of Electronic Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4804412\/4810250\/04810366.pdf?arnumber=4810366","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T03:17:39Z","timestamp":1489807059000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4810366\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/isqed.2009.4810366","relation":{},"subject":[],"published":{"date-parts":[[2009,3]]}}}