{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:38:39Z","timestamp":1725536319348},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479789","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T14:55:10Z","timestamp":1207148110000},"page":"520-525","source":"Crossref","is-referenced-by-count":2,"title":["Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution"],"prefix":"10.1109","author":[{"given":"Shinya","family":"Abe","sequence":"first","affiliation":[]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[]},{"given":"Takao","family":"Onoye","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"13"},{"doi-asserted-by":"publisher","key":"11","DOI":"10.1109\/JSSC.1989.572629"},{"year":"0","key":"12"},{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/ISSCC.2002.992977"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/ISSCC.2000.839838"},{"year":"1990","author":"bakoglu","journal-title":"Circuits Interconnections and Packaging for VLSI","key":"1"},{"key":"10","first-page":"81","article-title":"a predictive transistor model based on itrs roadmap","author":"uemura","year":"2006","journal-title":"Proc 2006 General Conference of IEICE"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/66.554480"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/CICC.2005.1568738"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/ICCAD.2005.1560197"},{"key":"4","first-page":"179","article-title":"clock methodology for low power design","author":"komoda","year":"2005","journal-title":"Proc VLSI Circuits Short Course Program"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/ASPDAC.2004.1337577"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/TCAD.2006.884403"}],"event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479789.pdf?arnumber=4479789","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T18:14:16Z","timestamp":1489688056000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4479789\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479789","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}