{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T16:43:24Z","timestamp":1732034604404},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/isie.2013.6563762","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T21:06:15Z","timestamp":1374786375000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["IEC 61850 GOOSE transfer time measurement in development stage"],"prefix":"10.1109","author":[{"given":"Miguel J.","family":"Gonzalez-Redondo","sequence":"first","affiliation":[]},{"given":"Antonio","family":"Moreno-Munoz","sequence":"additional","affiliation":[]},{"given":"Victor","family":"Pallares-Lopez","sequence":"additional","affiliation":[]},{"given":"Rafael J.","family":"Real-Calvo","sequence":"additional","affiliation":[]},{"given":"Manuel A. Ortiz","family":"Lopez","sequence":"additional","affiliation":[]},{"given":"Isabel M.","family":"Moreno-Garcia","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/MITP.2010.59"},{"journal-title":"Understanding and Simulating the IEC 61850 Standard","year":"2008","author":"liang","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2011.5984335"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TDC.2008.4517287"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ELINSL.2010.5549563"},{"journal-title":"High Performance IEC 61850 GOOSE and Protection Relay Testing","year":"2008","author":"ito","key":"6"},{"journal-title":"Performance Measurements for IEC 61850 IEDs and Systems","year":"2010","author":"steinhauser","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2005.1609182"},{"year":"0","key":"9"},{"year":"0","key":"8"}],"event":{"name":"2013 IEEE 22nd International Symposium on Industrial Electronics (ISIE)","start":{"date-parts":[[2013,5,28]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2013,5,31]]}},"container-title":["2013 IEEE International Symposium on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6554304\/6563588\/06563762.pdf?arnumber=6563762","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T03:03:04Z","timestamp":1490238184000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6563762\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/isie.2013.6563762","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}