{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T11:50:41Z","timestamp":1725709841632},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/irps48227.2022.9764540","type":"proceedings-article","created":{"date-parts":[[2022,5,2]],"date-time":"2022-05-02T16:44:23Z","timestamp":1651509863000},"page":"10A.3-1-10A.3-6","source":"Crossref","is-referenced-by-count":1,"title":["Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress"],"prefix":"10.1109","author":[{"given":"Kookjin","family":"Lee","sequence":"first","affiliation":[{"name":"KU Leuven,Department of Materials Science,Leuven,Belgium,3001"}]},{"given":"Ben","family":"Kaczer","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}]},{"given":"Anastasiia","family":"Kruv","sequence":"additional","affiliation":[{"name":"KU Leuven,Department of Materials Science,Leuven,Belgium,3001"}]},{"given":"Mario","family":"Gonzalez","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}]},{"given":"Geert","family":"Eneman","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}]},{"given":"Oguzhan Orkut","family":"Okudur","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}]},{"given":"Alexander","family":"Grill","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}]},{"given":"Jacopo","family":"Franco","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}]},{"given":"Andrea","family":"Vici","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}]},{"given":"Robin","family":"Degraeve","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}]},{"given":"Ingrid","family":"De Wolf","sequence":"additional","affiliation":[{"name":"KU Leuven,Department of Materials Science,Leuven,Belgium,3001"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/EDAPS.2011.6213770"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-matsci-082908-145312"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-4332(03)00042-4"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9129541"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.4939284"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/16.585549"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.837581"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08994-2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353601"},{"key":"ref6","first-page":"2f.2.1","article-title":"Transistor Aging and Reliability in 14nm Tri-Gate Technology","author":"novak","year":"2015","journal-title":"Proc IEEE Int Reliab Phys Symp"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241848"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9128327"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1134\/S1063782618130183"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-7909-3"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.11.022"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3104885"}],"event":{"name":"2022 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2022,3,27]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2022,3,31]]}},"container-title":["2022 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9764406\/9764408\/09764540.pdf?arnumber=9764540","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,14]],"date-time":"2022-06-14T16:41:46Z","timestamp":1655224906000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9764540\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/irps48227.2022.9764540","relation":{},"subject":[],"published":{"date-parts":[[2022,3]]}}}