{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:55:27Z","timestamp":1730271327628,"version":"3.28.0"},"reference-count":29,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9129147","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:20:26Z","timestamp":1593552026000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages"],"prefix":"10.1109","author":[{"given":"J. B.","family":"Roldan","sequence":"first","affiliation":[]},{"given":"D.","family":"Maldonado","sequence":"additional","affiliation":[]},{"given":"F.","family":"Jimenez-Molinos","sequence":"additional","affiliation":[]},{"given":"C.","family":"Acal","sequence":"additional","affiliation":[]},{"given":"J.E.","family":"Ruiz-Castro","sequence":"additional","affiliation":[]},{"given":"A.M.","family":"Aguilera","sequence":"additional","affiliation":[]},{"given":"F.","family":"Hui","sequence":"additional","affiliation":[]},{"given":"J.","family":"Kong","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Shi","sequence":"additional","affiliation":[]},{"given":"X.","family":"Jing","sequence":"additional","affiliation":[]},{"given":"C.","family":"Wen","sequence":"additional","affiliation":[]},{"given":"M.A.","family":"Villena","sequence":"additional","affiliation":[]},{"given":"M.","family":"Lanza","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2251314"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"13504","DOI":"10.1038\/srep13504","article-title":"Thermal crosstalk in 3-dimensional RRAM crossbar array","volume":"5","author":"sun","year":"2015","journal-title":"Sci Rep"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.5022040"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-018-0118-9"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1583\/aac615"},{"key":"ref15","article-title":"Graphene?Boron Nitride?Graphene Cross-Point Memristors with Three Stable Resistive States","author":"zhu","year":"2019","journal-title":"ACS Applied Materials & Interfaces"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1583\/ab1783"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-018-21138-x"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.5006995"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.cam.2018.06.010"},{"key":"ref28","article-title":"Input modeling with phase-type distributions and Markov models, Theory and Applications","author":"buchholz","year":"2014","journal-title":"Springer"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2147791"},{"key":"ref27","first-page":"28","article-title":"Simulation of cycle-to-cycle instabilities in SiOx-based ReRAM devices using a self-correlated process with long-term variation","volume":"40","author":"miranda","year":"2019","journal-title":"IEEE EDL"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.mser.2014.06.002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0006-8"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/aa7939"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"60","DOI":"10.1038\/s41586-018-0180-5","article-title":"Equivalent-accuracy accelerated neural-network training using analogue memory","volume":"558","author":"ambrogio","year":"2018","journal-title":"Nature"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2015.05.027"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/ma12223734"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-1074-8"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2833208"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201800143"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.3673239"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2418114"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2439812"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1583\/aa7129"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2210185"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2019.05.004"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.5079409"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2020,4,28]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09129147.pdf?arnumber=9129147","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:19:37Z","timestamp":1657333177000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9129147\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9129147","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}