{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,11]],"date-time":"2024-08-11T19:53:47Z","timestamp":1723406027791},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/irps45951.2020.9128816","type":"proceedings-article","created":{"date-parts":[[2020,6,30]],"date-time":"2020-06-30T21:20:26Z","timestamp":1593552026000},"source":"Crossref","is-referenced-by-count":11,"title":["Trap Dynamics Model Explaining the RON<\/sub> Stress\/Recovery Behavior in Carbon-Doped Power AlGaN\/GaN MOS-HEMTs"],"prefix":"10.1109","author":[{"given":"Nicolo","family":"Zagni","sequence":"first","affiliation":[]},{"given":"Alessandro","family":"Chini","sequence":"additional","affiliation":[]},{"given":"Francesco Maria","family":"Puglisi","sequence":"additional","affiliation":[]},{"given":"Paolo","family":"Pavan","sequence":"additional","affiliation":[]},{"given":"Matteo","family":"Meneghini","sequence":"additional","affiliation":[]},{"given":"Gaudenzio","family":"Meneghesso","sequence":"additional","affiliation":[]},{"given":"Enrico","family":"Zanoni","sequence":"additional","affiliation":[]},{"given":"Giovanni","family":"Verzellesi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861109"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2014.2304680"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2593791"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2014.2344439"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2019.8720472"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.4934184"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/31\/9\/093004"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.mssp.2017.10.009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.06.066"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2015.7123383"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2706090"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2069566"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.201900762"}],"event":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","location":"Dallas, TX, USA","start":{"date-parts":[[2020,4,28]]},"end":{"date-parts":[[2020,5,30]]}},"container-title":["2020 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125439\/9128217\/09128816.pdf?arnumber=9128816","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:20:21Z","timestamp":1657333221000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9128816\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/irps45951.2020.9128816","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}