{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T02:38:30Z","timestamp":1725676710771},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,7,3]],"date-time":"2023-07-03T00:00:00Z","timestamp":1688342400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,7,3]],"date-time":"2023-07-03T00:00:00Z","timestamp":1688342400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,7,3]]},"DOI":"10.1109\/iolts59296.2023.10224884","type":"proceedings-article","created":{"date-parts":[[2023,8,28]],"date-time":"2023-08-28T17:50:13Z","timestamp":1693245013000},"page":"1-3","source":"Crossref","is-referenced-by-count":0,"title":["Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System"],"prefix":"10.1109","author":[{"given":"Corrado","family":"De Sio","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica (DAUIN),Turin,Italy"}]},{"given":"Daniele","family":"Rizzieri","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica (DAUIN),Turin,Italy"}]},{"given":"Andrea","family":"Portaluri","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica (DAUIN),Turin,Italy"}]},{"given":"Salvatore G.","family":"La Greca","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica (DAUIN),Turin,Italy"}]},{"given":"Sarah","family":"Azimi","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica (DAUIN),Turin,Italy"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DFT50435.2020.9250861"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DFT52944.2021.9568342"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-78890-6_20"},{"journal-title":"Rhealstone Benchmarking of FreeRTOS and the Xilinx Zynq Extensible Processing Platform","year":"2013","author":"boger","key":"ref9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3169495"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.2995729"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12010169"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113733"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-21867-5_12"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD58065.2023.10192116"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6641\/aa57f6"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2022.114733"}],"event":{"name":"2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2023,7,3]]},"location":"Crete, Greece","end":{"date-parts":[[2023,7,5]]}},"container-title":["2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10224820\/10224858\/10224884.pdf?arnumber=10224884","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,18]],"date-time":"2023-09-18T17:43:06Z","timestamp":1695058986000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10224884\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iolts59296.2023.10224884","relation":{},"subject":[],"published":{"date-parts":[[2023,7,3]]}}}