{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:23:55Z","timestamp":1730269435248,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T00:00:00Z","timestamp":1662940800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,12]],"date-time":"2022-09-12T00:00:00Z","timestamp":1662940800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,12]]},"DOI":"10.1109\/iolts56730.2022.9897172","type":"proceedings-article","created":{"date-parts":[[2022,9,27]],"date-time":"2022-09-27T15:57:10Z","timestamp":1664294230000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["On Attacking IJTAG Architecture based on Locking SIB with Security LFSR"],"prefix":"10.1109","author":[{"given":"Gaurav","family":"Kumar","sequence":"first","affiliation":[{"name":"Indian Institute of Technology,Dept. of EE,Jammu,India"}]},{"given":"Anjum","family":"Riaz","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology,Dept. of EE,Jammu,India"}]},{"given":"Yamuna","family":"Prasad","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology,Dept. of CSE,Jammu,India"}]},{"given":"Satyadev","family":"Ahlawat","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology,Dept. of EE,Jammu,India"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2089071"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2007.70215"},{"key":"ref12","first-page":"1","article-title":"Preventing scan-based sidechannel attacks through key masking","author":"ahlawat","year":"2017","journal-title":"2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2019.8854411"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2019.8875355"},{"key":"ref15","article-title":"Don’t forget to lock your SIB: hiding instruments using P1687","author":"dworak","year":"2013","journal-title":"IEEE International Test Conference (ITC)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2391266"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2015.23"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/0-387-23483-7_224"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"388","DOI":"10.1007\/3-540-48405-1_25","article-title":"Differential power analysis","author":"kocher","year":"1999","journal-title":"Advances in cryptology — CRYPTO'99"},{"journal-title":"IEEE Standard","article-title":"IEEE standard for access and control of instrumentation embedded within a semiconductor device","year":"2014","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST.2016.7835558"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386969"},{"key":"ref5","article-title":"IEEE standard for test access port and boundary-scan architecture","volume":"1149","year":"2013","journal-title":"IEEE Std"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035355"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2005.193787"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242034"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116256"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.9"},{"key":"ref20","first-page":"56","article-title":"Securing IEEE 1687 standard on-chip instrumentation access using PUF","author":"s k k","year":"2016","journal-title":"2016 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS)"}],"event":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2022,9,12]]},"location":"Torino, Italy","end":{"date-parts":[[2022,9,14]]}},"container-title":["2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9897157\/9897171\/09897172.pdf?arnumber=9897172","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,10,14]],"date-time":"2022-10-14T16:54:42Z","timestamp":1665766482000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9897172\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,12]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iolts56730.2022.9897172","relation":{},"subject":[],"published":{"date-parts":[[2022,9,12]]}}}