{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T05:25:50Z","timestamp":1725686750034},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/iolts.2017.8046240","type":"proceedings-article","created":{"date-parts":[[2017,9,29]],"date-time":"2017-09-29T20:57:02Z","timestamp":1506718622000},"page":"96-99","source":"Crossref","is-referenced-by-count":4,"title":["In-situ Fmax\/Vmin tracking for energy efficiency and reliability optimization"],"prefix":"10.1109","author":[{"given":"Ivan","family":"Miro-Panades","sequence":"first","affiliation":[]},{"given":"Edith","family":"Beigne","sequence":"additional","affiliation":[]},{"given":"Olivier","family":"Billoint","sequence":"additional","affiliation":[]},{"given":"Yvain","family":"Thonnart","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2017.56"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16754"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2369503"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007148"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2015.21"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417956"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2418713"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2012.6242504"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.915629"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.915629"}],"event":{"name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2017,7,3]]},"location":"Thessaloniki, Greece","end":{"date-parts":[[2017,7,5]]}},"container-title":["2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8030509\/8046164\/08046240.pdf?arnumber=8046240","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T21:01:19Z","timestamp":1513198879000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8046240\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iolts.2017.8046240","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}