{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:21:49Z","timestamp":1730269309153,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,7]]},"DOI":"10.1109\/iolts.2010.5560236","type":"proceedings-article","created":{"date-parts":[[2010,9,7]],"date-time":"2010-09-07T16:30:39Z","timestamp":1283877039000},"page":"29-34","source":"Crossref","is-referenced-by-count":0,"title":["Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts"],"prefix":"10.1109","author":[{"given":"P.","family":"Rech","sequence":"first","affiliation":[]},{"given":"M.","family":"Grosso","sequence":"additional","affiliation":[]},{"given":"F.","family":"Melchiori","sequence":"additional","affiliation":[]},{"given":"D.","family":"Loparco","sequence":"additional","affiliation":[]},{"given":"D.","family":"Appello","sequence":"additional","affiliation":[]},{"given":"L.","family":"Dilillo","sequence":"additional","affiliation":[]},{"given":"A.","family":"Paccagnella","sequence":"additional","affiliation":[]},{"given":"M. Sonza","family":"Reorda","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2049119"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5195985"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839172"},{"journal-title":"IEEE 1550 Standard for Embedded Core Test (SECT)","year":"0","key":"ref13"},{"journal-title":"IEEE 1149 1 Standard Test Access Port and Boundary-Scan Architecture","year":"0","key":"ref14"},{"key":"ref15","first-page":"203","article-title":"Data mining intefrated circuit fails with fail commonalities","author":"huisman","year":"2004","journal-title":"IEEE International Test Conference"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386963"},{"journal-title":"IEEE International Test Conference","article-title":"Testing for systematic defects based on DfM guidelines","year":"2007","author":"kim","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253736"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.885007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/23.490893"},{"key":"ref6","first-page":"276","article-title":"DfT Reuse for Low-Cost Radiation Testing of SoCs: a case study","author":"bernardi","year":"2009","journal-title":"IEEE VLSI Test Symposium"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.26"},{"key":"ref8","first-page":"275","article-title":"A fault injection analysis of Virtex FPGA TMR design methodology","author":"lima","year":"2001","journal-title":"Eur Conf Radiation and Its Effect on Components and Systems (RADECS)"},{"key":"ref7","first-page":"559","article-title":"Ultra low alpha emission lead free solder for flip chip bumps","volume":"4587","author":"moriwaka","year":"2001","journal-title":"International Symposium on Microelectronics"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2002.1175846"},{"article-title":"SER – History, trends and challenges: a guide for designing with memory ICs","year":"2004","author":"ziegler","key":"ref1"},{"key":"ref9","first-page":"79","article-title":"Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs","author":"manuzzato","year":"2007","journal-title":"IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.35"},{"article-title":"SRIM - The Stopping and Range of Ions in Matter","year":"0","author":"ziegler","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.12"}],"event":{"name":"2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010)","start":{"date-parts":[[2010,7,5]]},"location":"Corfu, Greece","end":{"date-parts":[[2010,7,7]]}},"container-title":["2010 IEEE 16th International On-Line Testing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5550907\/5560185\/05560236.pdf?arnumber=5560236","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T19:38:55Z","timestamp":1489865935000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5560236\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,7]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/iolts.2010.5560236","relation":{},"subject":[],"published":{"date-parts":[[2010,7]]}}}