{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T01:24:08Z","timestamp":1725672248551},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,7]]},"DOI":"10.1109\/iolts.2008.29","type":"proceedings-article","created":{"date-parts":[[2008,7,24]],"date-time":"2008-07-24T18:00:26Z","timestamp":1216922426000},"page":"53-58","source":"Crossref","is-referenced-by-count":3,"title":["False Error Study of On-line Soft Error Detection Mechanisms"],"prefix":"10.1109","author":[{"given":"M. Kiran Kumar","family":"Reddy","sequence":"first","affiliation":[]},{"given":"Bharadwaj S.","family":"Amrutur","sequence":"additional","affiliation":[]},{"given":"Rubin A.","family":"Parekhji","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","first-page":"175","article-title":"gate-level mitigation techniques for neutron-induced soft error rate","author":"harminder","year":"2005","journal-title":"Proc of the Sixth International Symposium on Quality Electronic Design(ISQED)"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2004.85"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0119"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1979.19370"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269336"},{"key":"10","first-page":"787","article-title":"modified stability checking for on-line error detection","author":"satish","year":"2007","journal-title":"vlsid"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/23.212327"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251220"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/55.740661"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946456"},{"year":"0","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766651"}],"event":{"name":"2008 14th IEEE International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2008,7,7]]},"location":"Rhodes, Greece","end":{"date-parts":[[2008,7,9]]}},"container-title":["2008 14th IEEE International On-Line Testing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4567040\/4567041\/04567062.pdf?arnumber=4567062","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T14:42:27Z","timestamp":1489675347000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4567062\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,7]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iolts.2008.29","relation":{},"subject":[],"published":{"date-parts":[[2008,7]]}}}