{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,6]],"date-time":"2024-10-06T01:12:16Z","timestamp":1728177136654},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100004807","name":"DFG","doi-asserted-by":"publisher","award":["430054035"],"id":[{"id":"10.13039\/100004807","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5]]},"DOI":"10.1109\/imw52921.2022.9779287","type":"proceedings-article","created":{"date-parts":[[2022,5,25]],"date-time":"2022-05-25T15:42:43Z","timestamp":1653493363000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["Influence of Interfacial Oxide Layers in Hf0.5<\/sub>Zr0.5<\/sub>O2<\/sub> based ferroelectric capacitors on reliability performance"],"prefix":"10.1109","author":[{"given":"Ruben","family":"Alcala","sequence":"first","affiliation":[{"name":"NaMLab\/TU Dresden,Dresden,Germany"}]},{"given":"Furqan","family":"Mehmood","sequence":"additional","affiliation":[{"name":"NaMLab\/TU Dresden,Dresden,Germany"}]},{"given":"Pramoda","family":"Vishnumurthy","sequence":"additional","affiliation":[{"name":"NaMLab\/TU Dresden,Dresden,Germany"}]},{"given":"Terence","family":"Mittmann","sequence":"additional","affiliation":[{"name":"NaMLab\/TU Dresden,Dresden,Germany"}]},{"given":"Thomas","family":"Mikolajick","sequence":"additional","affiliation":[{"name":"NaMLab\/TU Dresden,Dresden,Germany"}]},{"given":"Uwe","family":"Schroeder","sequence":"additional","affiliation":[{"name":"NaMLab,Dresden,Germany"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2012.2216269"},{"key":"ref11","first-page":"161","author":"hoefflinger","year":"0","journal-title":"ITRS 2020"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2020.116515"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1021\/acsaelm.0c00184"},{"key":"ref4","first-page":"1","author":"lomenzo","year":"0","journal-title":"2019 19th Non-Volatile Memory Technology Symposium (NVMTS)"},{"journal-title":"Appl Phys Lett submitted","year":"2022","author":"mehmood","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/5.0012595"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/abbc98"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2018.12.008"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1149\/07532.0123ecst"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1021\/acs.inorgchem.7b03149"},{"key":"ref1","first-page":"1","author":"mulaosmanovic","year":"0","journal-title":"2021 IEEE International Reliability Physics Symposium (IRPS)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.5128502"}],"event":{"name":"2022 IEEE International Memory Workshop (IMW)","start":{"date-parts":[[2022,5,15]]},"location":"Dresden, Germany","end":{"date-parts":[[2022,5,18]]}},"container-title":["2022 IEEE International Memory Workshop (IMW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9779263\/9779243\/09779287.pdf?arnumber=9779287","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T17:17:55Z","timestamp":1656350275000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9779287\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/imw52921.2022.9779287","relation":{},"subject":[],"published":{"date-parts":[[2022,5]]}}}