乐胖代购免代理版

{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T00:25:19Z","timestamp":1725409519129},"reference-count":56,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,27]],"date-time":"2024-05-27T00:00:00Z","timestamp":1716768000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,27]],"date-time":"2024-05-27T00:00:00Z","timestamp":1716768000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"NSF","doi-asserted-by":"publisher","award":["CCF-2100037,CCF-2145774"],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,27]]},"DOI":"10.1109\/icst60714.2024.00032","type":"proceedings-article","created":{"date-parts":[[2024,8,27]],"date-time":"2024-08-27T17:19:42Z","timestamp":1724779182000},"page":"269-280","source":"Crossref","is-referenced-by-count":1,"title":["Automatically Reproducing Timing-Dependent Flaky-Test Failures"],"prefix":"10.1109","author":[{"given":"Shanto","family":"Rahman","sequence":"first","affiliation":[{"name":"University of Texas at Austin,Austin,United States"}]},{"given":"Aaron","family":"Massey","sequence":"additional","affiliation":[{"name":"Google,Boulder,United States"}]},{"given":"Wing","family":"Lam","sequence":"additional","affiliation":[{"name":"George Mason University,Fairfax,United States"}]},{"given":"August","family":"Shi","sequence":"additional","affiliation":[{"name":"University of Texas at Austin,Austin,United States"}]},{"given":"Jonathan","family":"Bell","sequence":"additional","affiliation":[{"name":"Northeastern University,Boston,United States"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635920"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3476105"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2019.00038"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2610404"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE43902.2021.00140"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICST49551.2021.00026"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2016.40"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3468264.3473931"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME46990.2020.00037"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3379597.3387482"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tse.2022.3201209"},{"key":"ref16","article-title":"Modeling and ranking flaky tests at Apple","author":"Kowalczyk","year":"2020","journal-title":"ICSE SEIP"},{"key":"ref17","article-title":"Automated analysis of flakiness-mitigating delays","author":"Malm","year":"2020","journal-title":"AST"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/SCAM.2018.00009"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-SEIP.2017.16"},{"key":"ref22","article-title":"The state of continuous integration testing at Google","author":"Micco","year":"2017","journal-title":"ICST"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-SEIP.2017.13"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2017.71"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.66"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.133"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330570"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/3377811.3381749"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/3236024.3275529"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/3338906.3338945"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICST53961.2022.00034"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3510457.3513037"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/2771783.2771793"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2018.00011"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635917"},{"volume-title":"Supplemental data for \u201cAutomatically reproducing timing-dependent flaky-test failures","year":"2024","author":"Rahman","key":"ref37"},{"volume-title":"Numerical Analysis","year":"1985","author":"Burden","key":"ref39"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48166-4_16"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE5003.2020.00045"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1145\/2931037.2948707"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ICST60714.2024.00018"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME55016.2022.00039"},{"key":"ref46","article-title":"An exploratory study of debugging episodes","author":"Alaboudi","year":"2021","journal-title":"arXiv"},{"key":"ref47","article-title":"The effects of computational resources on flaky tests","author":"Silva","year":"2023","journal-title":"arXiv"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/icse43902.2021.00140"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/ICST53961.2022.00020"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1145\/3540250.3558956"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510194"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/MSR52588.2021.00034"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786823"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1145\/3468264.3468584"},{"key":"ref58","article-title":"A container-based infrastructure for fuzzy-driven root causing of flaky tests","author":"Terragni","year":"2020","journal-title":"ICSE NIER"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1145\/174267.166789"},{"key":"ref60","article-title":"Heuristics for finding concur-rent bugs","author":"Eytani","year":"2003","journal-title":"IPDPS"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1145\/376656.376848"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1016\/S1571-0661(04)80582-6"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1016\/j.entcs.2006.02.004"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1145\/1147403.1147410"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-70889-6_14"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1145\/2544173.2509538"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1145\/2666356.2594330"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1145\/2931037.2931069"}],"event":{"name":"2024 IEEE Conference on Software Testing, Verification and Validation (ICST)","start":{"date-parts":[[2024,5,27]]},"location":"Toronto, ON, Canada","end":{"date-parts":[[2024,5,31]]}},"container-title":["2024 IEEE Conference on Software Testing, Verification and Validation (ICST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10638518\/10638509\/10638561.pdf?arnumber=10638561","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T04:45:27Z","timestamp":1725338727000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10638561\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,27]]},"references-count":56,"URL":"https:\/\/doi.org\/10.1109\/icst60714.2024.00032","relation":{},"subject":[],"published":{"date-parts":[[2024,5,27]]}}}