{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T01:33:40Z","timestamp":1729647220674,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,4]]},"DOI":"10.1109\/icst.2016.18","type":"proceedings-article","created":{"date-parts":[[2016,7,21]],"date-time":"2016-07-21T16:50:17Z","timestamp":1469119817000},"page":"320-329","source":"Crossref","is-referenced-by-count":14,"title":["MuVM: Higher Order Mutation Analysis Virtual Machine for C"],"prefix":"10.1109","author":[{"given":"Susumu","family":"Tokumoto","sequence":"first","affiliation":[]},{"given":"Hiroaki","family":"Yoshida","sequence":"additional","affiliation":[]},{"given":"Kazunori","family":"Sakamoto","sequence":"additional","affiliation":[]},{"given":"Shinichi","family":"Honiden","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/spe.4380210704"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/125489.125473"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2012.158"},{"journal-title":"Google (2015 May) Google c++ testing framework","year":"0","key":"ref13"},{"article-title":"Schema-based mutation analysis: A new test data adequacy assessment method","year":"1995","author":"untch","key":"ref14"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"94","DOI":"10.1109\/TAIC-PART.2008.18","article-title":"Milu: A customizable, runtime-optimized higher order mutation testing tool for the full c language","author":"jia","year":"2008","journal-title":"Practice and Research Techniques 2008 TAIC PART '08 Testing Academic & Industrial Conference"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"609","DOI":"10.1007\/978-3-642-22110-1_49","article-title":"Klover: A symbolic execution and automatic test generation tool for c++ programs","author":"li","year":"2011","journal-title":"Proceedings of the 23rd International Conference on Computer Aided Verification Ser CAV'11"},{"key":"ref17","first-page":"439","article-title":"Constrained mutation in c programs","author":"wong","year":"1994","journal-title":"Proceedings of the 8th Brazilian Symposium on Software Engneering"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2610388"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.103"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SCAM.2008.36"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"279","DOI":"10.1109\/TSE.1977.231145","article-title":"testing programs with the aid of a compiler","volume":"se 3","author":"hamlet","year":"1977","journal-title":"IEEE Transactions on Software Engineering"},{"key":"ref6","article-title":"Design of mutant operators for the c programming language","author":"agrawal","year":"1989","journal-title":"Technique Report SERC-TR-41-P Purdue University West Lafayette Indiana"},{"key":"ref5","first-page":"34","article-title":"Mutation testing for the new century","author":"offutt","year":"0","journal-title":"Norwell MA USA Kluwer Academic Publishers 2001 ch Mutation 2000 Uniting the Orthogonal"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/154183.154265"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.62"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/C-M.1978.218136"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985847"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.308"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1982.235571"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.38"}],"event":{"name":"2016 IEEE International Conference on Software Testing, Verification and Validation (ICST)","start":{"date-parts":[[2016,4,11]]},"location":"Chicago, IL, USA","end":{"date-parts":[[2016,4,15]]}},"container-title":["2016 IEEE International Conference on Software Testing, Verification and Validation (ICST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7510576\/7515425\/07515483.pdf?arnumber=7515483","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T14:57:25Z","timestamp":1498316245000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7515483\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/icst.2016.18","relation":{},"subject":[],"published":{"date-parts":[[2016,4]]}}}