{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T04:48:26Z","timestamp":1729658906400,"version":"3.28.0"},"reference-count":35,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010]]},"DOI":"10.1109\/icst.2010.61","type":"proceedings-article","created":{"date-parts":[[2010,6,15]],"date-time":"2010-06-15T10:37:44Z","timestamp":1276598264000},"page":"89-98","source":"Crossref","is-referenced-by-count":9,"title":["MbSRT2: Model-Based Selective Regression Testing with Traceability"],"prefix":"10.1109","author":[{"given":"Leila","family":"Naslavsky","sequence":"first","affiliation":[]},{"given":"Hadar","family":"Ziv","sequence":"additional","affiliation":[]},{"given":"Debra J.","family":"Richardson","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Scenarios in System Development Current Practice","year":"1998","author":"weidenhaupt","key":"ref33"},{"key":"ref32","article-title":"Model Based Regression Test Reduction Using Dependence Analysis","author":"vaysburg","year":"0","journal-title":"International Conference on Software Maintenance (ICSM)"},{"journal-title":"Practical Model-Based Testing","year":"2007","author":"utting","key":"ref31"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/32.553698"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1101908.1101919"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ENABL.2001.953386"},{"key":"ref10","article-title":"Weaving Models with the Eclipse AMW plugin","author":"didonet del fabro","year":"0","journal-title":"Eclipse Modeling Symposium Eclipse Summit Europe"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2006.10"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1370731.1370738"},{"journal-title":"Introduction to Software Engineering Desing","year":"0","author":"fox","key":"ref13"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"386","DOI":"10.1007\/s10270-005-0089-y","article-title":"Validating UML and OCL Models in USE by Automatic Snapshot Generation","volume":"4","author":"gogolla","year":"0","journal-title":"Journal on Software and System Modeling"},{"journal-title":"Regression Test Selection for Java Software conference on Object-Oriented Programming Systems Languages and Applications","year":"0","author":"harrold","key":"ref15"},{"journal-title":"An Integrated Approach to Software Engineering","year":"2006","author":"jalote","key":"ref16"},{"key":"ref17","article-title":"Loosely Coupled Traceability for ATL","author":"jouault","year":"0","journal-title":"European Conference on Model Driven Architecture Workshop on Traceability"},{"key":"ref18","article-title":"Insights into regression testing","author":"leung","year":"0","journal-title":"International Conference on Software Maintenace"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/EUROMICRO.2007.61"},{"key":"ref28","first-page":"282","article-title":"Coverage Criteria for Testing of Object Interactions in Sequence Diagrams","author":"rountev","year":"2005","journal-title":"Fundamental Approaches to Software Engineering"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/367008.367015"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/32.536955"},{"journal-title":"A unifying framework supporting the analysis and development of safe regression test selection techniques","year":"1999","author":"bible","key":"ref3"},{"journal-title":"Automating Impact Analysis and Regression Test Selection Base on UML Designs","year":"2002","author":"briand","key":"ref6"},{"journal-title":"Software Traceability A Roadmap Advances in Software Engineering and Knowledge Engineering","year":"2005","author":"spanoudakis","key":"ref29"},{"key":"ref5","first-page":"579","article-title":"Round-trip Scenario Test","author":"binder","year":"2000","journal-title":"Testing Object-Oriented Systems Models Patterns and Tools"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2005.05.001"},{"key":"ref7","article-title":"Automating Regression Test Selection Based on UML Designs","volume":"52","author":"briand","year":"0","journal-title":"Information and Software Technology"},{"journal-title":"EMF Compare Plug-in","year":"0","key":"ref2"},{"key":"ref9","first-page":"29","article-title":"Model Differences in the Eclipse Modelling Framework","volume":"ix","author":"brun","year":"2008","journal-title":"The European Journal for the Informatics Professional"},{"journal-title":"ADT ATL Development Tools","year":"0","key":"ref1"},{"key":"ref20","first-page":"1","article-title":"Towards software architecture-based regression testing","author":"muccini","year":"2006","journal-title":"Journal of Systems and Software Special Issue on “Architecting Dependable Systems”"},{"key":"ref22","article-title":"Scenario-based and State Machine-based Testing: An Evaluation of Automated Approaches","author":"naslavsky","year":"0","journal-title":"UCI-ISR-06–13"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1291535.1291546"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/1029894.1029928"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.344"},{"journal-title":"Efficient Effective Regression Testing Using Safe Test Selection Techniques","year":"1995","author":"rothermel","key":"ref26"},{"key":"ref25","article-title":"Regression Test UML designs","author":"pilskans","year":"0","journal-title":"Proc of Intl Conference on Software Maintenance"}],"event":{"name":"2010 Third International Conference on Software Testing, Verification and Validation","start":{"date-parts":[[2010,4,6]]},"location":"Paris, France","end":{"date-parts":[[2010,4,10]]}},"container-title":["2010 Third International Conference on Software Testing, Verification and Validation"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5477032\/5477034\/05477097.pdf?arnumber=5477097","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T05:30:13Z","timestamp":1497850213000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5477097\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/icst.2010.61","relation":{},"subject":[],"published":{"date-parts":[[2010]]}}}