{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T23:28:16Z","timestamp":1730244496965,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,21]],"date-time":"2022-09-21T00:00:00Z","timestamp":1663718400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2022,9,21]],"date-time":"2022-09-21T00:00:00Z","timestamp":1663718400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,21]]},"DOI":"10.1109\/icicdt56182.2022.9933087","type":"proceedings-article","created":{"date-parts":[[2022,11,4]],"date-time":"2022-11-04T02:07:33Z","timestamp":1667527653000},"page":"88-88","source":"Crossref","is-referenced-by-count":1,"title":["Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control"],"prefix":"10.1109","author":[{"given":"S.","family":"Subhechha","sequence":"first","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"N.","family":"Rassoul","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"A.","family":"Belmonte","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"H.","family":"Hody","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"H.","family":"Dekkers","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"M. J.","family":"van Setten","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"A.","family":"Chasin","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"S.H.","family":"Sharifi","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"K.","family":"Banerjee","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"H.","family":"Puliyalil","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"S.","family":"Kundu","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"M.","family":"Pak","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"D.","family":"Tsvetanova","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"N.","family":"Bazzazian","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"K.","family":"Vandersmissen","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"D.","family":"Batuk","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"J.","family":"Geypen","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"J.","family":"Heijlen","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"R.","family":"Delhougne","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]},{"given":"G. S.","family":"Kar","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,B-3001"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/cryst9020075"},{"journal-title":"IEDM","first-page":"10.5.1","year":"2021","author":"duan","key":"ref3"},{"key":"ref10","first-page":"1","volume":"3","author":"jeon","year":"0","journal-title":"App Mat & Int"},{"journal-title":"VLSI","first-page":"1","year":"2021","author":"subhechha","key":"ref6"},{"journal-title":"VLSI","first-page":"th2.3","year":"2020","author":"samanta","key":"ref11"},{"journal-title":"SSDM","first-page":"j-6-03","year":"2021","author":"rassoul","key":"ref5"},{"journal-title":"VLSI","first-page":"1","year":"2022","author":"subhechha","key":"ref8"},{"year":"0","author":"kruv","key":"ref7"},{"journal-title":"IEDM","first-page":"10.6.1","year":"2020","author":"belmonte","key":"ref2"},{"key":"ref9","first-page":"4037","volume":"3","author":"van setten","year":"0","journal-title":"ACS AEM"},{"journal-title":"EDL","year":"2015","author":"zhou","key":"ref1"}],"event":{"name":"2022 International Conference on IC Design and Technology (ICICDT)","start":{"date-parts":[[2022,9,21]]},"location":"Hanoi, Vietnam","end":{"date-parts":[[2022,9,23]]}},"container-title":["2022 International Conference on IC Design and Technology (ICICDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9933043\/9933065\/09933087.pdf?arnumber=9933087","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T20:19:37Z","timestamp":1669666777000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9933087\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,21]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/icicdt56182.2022.9933087","relation":{},"subject":[],"published":{"date-parts":[[2022,9,21]]}}}