{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T22:39:50Z","timestamp":1730241590259,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,2,5]],"date-time":"2023-02-05T00:00:00Z","timestamp":1675555200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,5]],"date-time":"2023-02-05T00:00:00Z","timestamp":1675555200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,2,5]]},"DOI":"10.1109\/iceic57457.2023.10049904","type":"proceedings-article","created":{"date-parts":[[2023,3,10]],"date-time":"2023-03-10T18:20:59Z","timestamp":1678472459000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Empirical Analysis of Side-Channel Attack Resistance of HLS-designed AES Circuits"],"prefix":"10.1109","author":[{"given":"Takumi","family":"Mizuno","sequence":"first","affiliation":[{"name":"Ritsumeikan University,Graduate School of Science and Engineering,Shiga,Japan"}]},{"given":"Hiroki","family":"Nishikawa","sequence":"additional","affiliation":[{"name":"Osaka University,Graduate School of Information Science and Technology,Osaka,Japan"}]},{"given":"Xiangbo","family":"Kong","sequence":"additional","affiliation":[{"name":"Ritsumeikan University,Graduate School of Science and Engineering,Shiga,Japan"}]},{"given":"Hiroyuki","family":"Tomiyama","sequence":"additional","affiliation":[{"name":"Ritsumeikan University,Graduate School of Science and Engineering,Shiga,Japan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2924045"},{"key":"ref2","first-page":"388","article-title":"Differential power analysis","volume-title":"Annual International Cryptology Conference","author":"Paul"},{"key":"ref3","first-page":"16","article-title":"Correlation power analysis with a leakage model","volume-title":"International Workshop on Cryptographic Hardware and Embedded Systems","author":"Eric"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ITCC.2004.1286711"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2012.10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342189"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MECO52532.2021.9460288"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC53507.2021.9613900"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.83"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45234-8_68"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.2197\/ipsjjip.17.242"},{"key":"ref12","first-page":"115","article-title":"A testing methodology for side-channel resistance validation","volume":"7","author":"Goodwill","year":"2011","journal-title":"NIST Non-Invasive Attack Testing Workshop"},{"article-title":"A toolkit for power behavior analysis of HLS-designed FPGA circuits","volume-title":"IEEE Symposium on Low-Power and High-Speed Chips and Systems (COOL Chips)","author":"Zhang","key":"ref13"}],"event":{"name":"2023 International Conference on Electronics, Information, and Communication (ICEIC)","start":{"date-parts":[[2023,2,5]]},"location":"Singapore","end":{"date-parts":[[2023,2,8]]}},"container-title":["2023 International Conference on Electronics, Information, and Communication (ICEIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10049840\/10049805\/10049904.pdf?arnumber=10049904","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T18:16:03Z","timestamp":1707848163000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10049904\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iceic57457.2023.10049904","relation":{},"subject":[],"published":{"date-parts":[[2023,2,5]]}}}