{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T20:36:48Z","timestamp":1730234208542,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/iccd.2018.00031","type":"proceedings-article","created":{"date-parts":[[2019,1,18]],"date-time":"2019-01-18T00:45:17Z","timestamp":1547772317000},"page":"148-151","source":"Crossref","is-referenced-by-count":4,"title":["OldSpot: A Pre-RTL Model for Fine-Grained Aging and Lifetime Optimization"],"prefix":"10.1109","author":[{"given":"Alec","family":"Roelke","sequence":"first","affiliation":[]},{"given":"Xinfei","family":"Guo","sequence":"additional","affiliation":[]},{"given":"Mircea","family":"Stan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2629677"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.876103"},{"key":"ref12","first-page":"5a","article-title":"A consistent physical framework for Nand P BTl in HKMG MOSFRTs-","author":"joshi","year":"2012","journal-title":"TRPS-"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2238237"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593180"},{"journal-title":"Hot Carrier Degradation in Semiconductor Devices","year":"2014","author":"grasser","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1101(02)00151-X"},{"journal-title":"Engineering Reliability Fundamentals and Applications","year":"1993","author":"ramakumar","key":"ref17"},{"journal-title":"Benchmarking Modern Multiprocessors","year":"2011","author":"bienia","key":"ref18"},{"key":"ref19","first-page":"183","article-title":"Archl-P: Rapid prototyping of pre-RTL fioorplans","author":"faust","year":"2012","journal-title":"VLSI-SoC"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1878961.1879013"},{"key":"ref3","first-page":"51","article-title":"Agesim: A simulation framework for evaluating the lifetime reliability of processor-based socs","author":"huang","year":"2010","journal-title":"DATE"},{"key":"ref6","first-page":"520","article-title":"Exploiting structural duplication for lifetime relia-bility enhancement.","author":"srinivasan","year":"2005","journal-title":"ISCA"},{"key":"ref5","first-page":"276","article-title":"The case for lifetime reliability-aware microprocessors.","volume":"32","author":"srinivasan","year":"2004","journal-title":"ISCA"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669172"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2012.6263957"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2014.6974677"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2024716.2024718"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2017.56"},{"key":"ref20","first-page":"373","article-title":"Architecture implications of pads as a scarce resource","volume":"42","author":"zhang","year":"2014","journal-title":"ISCA"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2009.5275083"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2004.1419253"},{"key":"ref24","first-page":"4a","article-title":"Combined trap generation and transient trap occupanc, model for time evolution of nbti during dc multi-cycle and ac stress","author":"goel","year":"2015","journal-title":"Reliability Physics Symposium (IRPS) 2015 IEEE International"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910130"},{"key":"ref25","first-page":"24","article-title":"The SPLASH-2 programs: Characterization and methodological considerations","author":"woo","year":"1995","journal-title":"ISCA"}],"event":{"name":"2018 IEEE 36th International Conference on Computer Design (ICCD)","start":{"date-parts":[[2018,10,7]]},"location":"Orlando, FL, USA","end":{"date-parts":[[2018,10,10]]}},"container-title":["2018 IEEE 36th International Conference on Computer Design (ICCD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8615120\/8615630\/08615681.pdf?arnumber=8615681","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T22:16:57Z","timestamp":1643235417000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8615681\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/iccd.2018.00031","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}