{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:07:18Z","timestamp":1729627638033,"version":"3.28.0"},"reference-count":34,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,11]]},"DOI":"10.1109\/iccad.2013.6691102","type":"proceedings-article","created":{"date-parts":[[2014,2,10]],"date-time":"2014-02-10T16:26:57Z","timestamp":1392049617000},"page":"85-90","source":"Crossref","is-referenced-by-count":29,"title":["Improved SAT-based ATPG: More constraints, better compaction"],"prefix":"10.1109","author":[{"given":"Stephan","family":"Eggersgluss","sequence":"first","affiliation":[]},{"given":"Robert","family":"Wille","sequence":"additional","affiliation":[]},{"given":"Rolf","family":"Drechsler","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.43"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2205479"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923107"},{"journal-title":"Department of Electrical Engineering","article-title":"Atalanta: An efficient ATPG for combinational circuit","year":"1993","author":"lee","key":"33"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/43.536723"},{"key":"34","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2152450"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2005.55"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144279"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/43.108614"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090834"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/43.469663"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.35"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429391"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.822103"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.14"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2012.09.010"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.31"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219063"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.100"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2013.6562675"},{"key":"29","doi-asserted-by":"crossref","first-page":"502","DOI":"10.1007\/978-3-540-24605-3_37","article-title":"An extensible SAT solver","volume":"2919","author":"ee?n","year":"2004","journal-title":"International Conference on Theory and Applications of Satisfiability Testing Ser Lecture Notes in Computer Science"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/43.3140"},{"key":"2","first-page":"189","article-title":"Test generation and dynamic compaction of tests","author":"goel","year":"1979","journal-title":"International Test Conference"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.54"},{"journal-title":"International Technology Roadmap for Semiconductors Test and Test Equipment","year":"2011","key":"1"},{"key":"30","first-page":"386","article-title":"Conflict-driven answer set solving","author":"gebser","year":"2007","journal-title":"International Joint Conference on Artificial Intelligence"},{"key":"7","first-page":"1100","article-title":"On the role of independent fault sets in the generation of minimal test sets","author":"akers","year":"1987","journal-title":"Digest of Papers - International Test Conference"},{"key":"6","first-page":"1088","article-title":"On static test compaction and test pattern ordering for scan designs","author":"lin","year":"2001","journal-title":"IEEE International Test Conference (TC)"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2011.77"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/43.238040"},{"key":"31","doi-asserted-by":"crossref","first-page":"1","DOI":"10.3233\/SAT190014","article-title":"Translating pseudo-boolean constraints into SAT","volume":"2","author":"ee?n","year":"2006","journal-title":"Journal of Satisfiability Boolean Modeling and Computation"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/EUASIC.1992.228026"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/43.476580"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519511"}],"event":{"name":"2013 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)","start":{"date-parts":[[2013,11,18]]},"location":"San Jose, CA","end":{"date-parts":[[2013,11,21]]}},"container-title":["2013 IEEE\/ACM International Conference on Computer-Aided Design (ICCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6679730\/6691081\/06691102.pdf?arnumber=6691102","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,15]],"date-time":"2020-08-15T07:22:42Z","timestamp":1597476162000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6691102\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,11]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/iccad.2013.6691102","relation":{},"subject":[],"published":{"date-parts":[[2013,11]]}}}