{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:08:15Z","timestamp":1730225295887,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,1]]},"DOI":"10.1109\/hpca.2010.5416629","type":"proceedings-article","created":{"date-parts":[[2010,4,7]],"date-time":"2010-04-07T18:36:36Z","timestamp":1270665396000},"page":"1-12","source":"Crossref","is-referenced-by-count":17,"title":["Explaining cache SER anomaly using DUE AVF measurement"],"prefix":"10.1109","author":[{"given":"Arijit","family":"Biswas","sequence":"first","affiliation":[]},{"given":"Charles","family":"Recchia","sequence":"additional","affiliation":[]},{"given":"Shubhendu S.","family":"Mukherjee","sequence":"additional","affiliation":[]},{"given":"Vinod","family":"Ambrose","sequence":"additional","affiliation":[]},{"given":"Leo","family":"Chan","sequence":"additional","affiliation":[]},{"given":"Aamer","family":"Jaleel","sequence":"additional","affiliation":[]},{"given":"Athanasios E.","family":"Papathanasiou","sequence":"additional","affiliation":[]},{"given":"Mike","family":"Plaster","sequence":"additional","affiliation":[]},{"given":"Norbert","family":"Seifert","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1065010.1065034"},{"key":"ref11","first-page":"167","article-title":"Profile-Guided Post-Link Stride Prefetching","author":"k","year":"2002","journal-title":"Proceedings of the 2002 International Conference on Supercomputing (ICS'02)"},{"key":"ref12","article-title":"Architecture Design for Soft Errors","author":"mukherjee","year":"2008","journal-title":"Elsevier Inc"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.858334"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/23.736546"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2004.28"},{"key":"ref17","article-title":"Strong Inference","volume":"146","author":"platt","year":"1964","journal-title":"SCIENCE Magazine"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0275"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558882"},{"key":"ref4","first-page":"121_07.1","article-title":"CMOS Soft Errors and Server Design","author":"bossen","year":"2002","journal-title":"2002 IEEE Int'l Reliability Physics Symposium Tutorial Notes—Reliability Fundamentals"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1080695.1070014"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/2.982918"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1118299.1118507"},{"key":"ref8","article-title":"CMP$im: A Pin-Based On-The-Fly Multi-Core Cache Simulator","author":"jaleel","year":"2008","journal-title":"Workshop on Modeling Benchmarking and Simulation"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/23.819107"},{"journal-title":"JEDEC Test Standard No 89A","article-title":"Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices","year":"2006","key":"ref2"},{"journal-title":"JEDEC JESD89-3A","article-title":"Test Method for Beam Accelerated Soft Error Rate","year":"0","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1394608.1382150"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251220"}],"event":{"name":"2010 IEEE 16th International Symposium on High Performance Computer Architecture (HPCA)","start":{"date-parts":[[2010,1,9]]},"location":"Bangalore, India","end":{"date-parts":[[2010,1,14]]}},"container-title":["HPCA - 16 2010 The Sixteenth International Symposium on High-Performance Computer Architecture"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5410726\/5416625\/05416629.pdf?arnumber=5416629","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T03:59:12Z","timestamp":1489895952000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5416629\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,1]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/hpca.2010.5416629","relation":{},"subject":[],"published":{"date-parts":[[2010,1]]}}}