{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T10:11:50Z","timestamp":1725531110154},"reference-count":0,"publisher":"IEEE Comput. Soc. Press","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ftcs.1988.5343","type":"proceedings-article","created":{"date-parts":[[2003,1,6]],"date-time":"2003-01-06T19:03:04Z","timestamp":1041879784000},"page":"354-359","source":"Crossref","is-referenced-by-count":8,"title":["Masking asymmetric line faults using semi-distance codes"],"prefix":"10.1109","author":[{"given":"K.","family":"Matsuzawa","sequence":"first","affiliation":[]},{"given":"E.","family":"Fujiwara","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","location":"Tokyo, Japan"},"container-title":["[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx2\/210\/275\/00005343.pdf?arnumber=5343","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,8]],"date-time":"2017-03-08T22:46:11Z","timestamp":1489013171000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5343\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/ftcs.1988.5343","relation":{},"subject":[]}}