{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T11:19:08Z","timestamp":1722943148920},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/ets56758.2023.10174113","type":"proceedings-article","created":{"date-parts":[[2023,7,12]],"date-time":"2023-07-12T17:20:34Z","timestamp":1689182434000},"source":"Crossref","is-referenced-by-count":4,"title":["Online Fault Detection and Diagnosis in RRAM"],"prefix":"10.1109","author":[{"given":"Moritz","family":"Fieback","sequence":"first","affiliation":[{"name":"Delft University of Technology,Computer Engineering Department,Delft,The Netherlands"}]},{"given":"Filip","family":"Bradari\u0107","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Computer Engineering Department,Delft,The Netherlands"}]},{"given":"Mottaqiallah","family":"Taouil","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Computer Engineering Department,Delft,The Netherlands"}]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Computer Engineering Department,Delft,The Netherlands"}]}],"member":"263","reference":[{"key":"ref13","first-page":"33","author":"chen","year":"2022","journal-title":"Resistive Random Access Memory (RRAM) Technology From Material Device Selector 3D Integration to Bottom-Up Fabrication"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00085"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-021-27575-z"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2014.2334311"},{"key":"ref11","first-page":"1","article-title":"Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs","author":"copetti","year":"2021","journal-title":"2021 IFIP\/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.206"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2016.2546199"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2013.2253329"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838348"},{"key":"ref19","author":"bushnell","year":"2000","journal-title":"Essentials of Electronic Testing For Digital Memory & Mixed-Signal VLSI Circuits"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-6706-3"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3098639"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/el.2017.2424"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791518"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.5108654"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116247"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046206"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2020.2982830"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9473999"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/el.2016.1693"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2013.219"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/EDSSC.2017.8126415"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2691263"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IMW51353.2021.9439607"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3510851"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETS50041.2021.9465401"}],"event":{"name":"2023 IEEE European Test Symposium (ETS)","location":"Venezia, Italy","start":{"date-parts":[[2023,5,22]]},"end":{"date-parts":[[2023,5,26]]}},"container-title":["2023 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10173930\/10173940\/10174113.pdf?arnumber=10174113","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T17:56:12Z","timestamp":1690912572000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10174113\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/ets56758.2023.10174113","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}