{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T14:30:38Z","timestamp":1725719438569},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,23]],"date-time":"2022-05-23T00:00:00Z","timestamp":1653264000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,23]],"date-time":"2022-05-23T00:00:00Z","timestamp":1653264000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,23]]},"DOI":"10.1109\/ets54262.2022.9810461","type":"proceedings-article","created":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T19:37:54Z","timestamp":1656704274000},"page":"1-9","source":"Crossref","is-referenced-by-count":0,"title":["Special Session on RF\/5G Test"],"prefix":"10.1109","author":[{"given":"William R.","family":"Eisenstadt","sequence":"first","affiliation":[{"name":"University of Florida,Department of Electrial Engineering,Gainesville,FL,USA"}]},{"given":"Mark","family":"Roos","sequence":"additional","affiliation":[]},{"given":"Devin","family":"Morris","sequence":"additional","affiliation":[]},{"given":"Jos\u00e9 Luis","family":"Gonz\u00e1lez-Jim\u00e9nez","sequence":"additional","affiliation":[]},{"given":"Christopery","family":"Mounet","sequence":"additional","affiliation":[]},{"given":"Manuel J.","family":"Barragan","sequence":"additional","affiliation":[]},{"given":"Gildas","family":"Leger","sequence":"additional","affiliation":[]},{"given":"Florent","family":"Cilici","sequence":"additional","affiliation":[]},{"given":"Estelle","family":"Lauga-Larroze","sequence":"additional","affiliation":[]},{"given":"Salvador","family":"Mir","sequence":"additional","affiliation":[]},{"given":"Sylvain","family":"Bourdel","sequence":"additional","affiliation":[]},{"given":"M.","family":"Margalef-Rovira","sequence":"additional","affiliation":[]},{"given":"I.","family":"Alaji","sequence":"additional","affiliation":[]},{"given":"H.","family":"Ghanem","sequence":"additional","affiliation":[]},{"given":"G.","family":"Ducournau","sequence":"additional","affiliation":[]},{"given":"C.","family":"Gaquiere","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2022 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2022,5,23]]},"location":"Barcelona, Spain","end":{"date-parts":[[2022,5,27]]}},"container-title":["2022 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9810327\/9810358\/09810461.pdf?arnumber=9810461","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,19]],"date-time":"2024-02-19T20:02:40Z","timestamp":1708372960000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9810461\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,23]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/ets54262.2022.9810461","relation":{},"subject":[],"published":{"date-parts":[[2022,5,23]]}}}