{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T02:31:38Z","timestamp":1725589898097},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,24]],"date-time":"2021-05-24T00:00:00Z","timestamp":1621814400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,24]],"date-time":"2021-05-24T00:00:00Z","timestamp":1621814400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,24]],"date-time":"2021-05-24T00:00:00Z","timestamp":1621814400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,24]]},"DOI":"10.1109\/ets50041.2021.9465441","type":"proceedings-article","created":{"date-parts":[[2021,6,29]],"date-time":"2021-06-29T16:23:46Z","timestamp":1624983826000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs"],"prefix":"10.1109","author":[{"given":"G. Cardoso","family":"Medeiros","sequence":"first","affiliation":[]},{"given":"M.","family":"Fieback","sequence":"additional","affiliation":[]},{"given":"A.","family":"Gebregiorgis","sequence":"additional","affiliation":[]},{"given":"M.","family":"Taouil","sequence":"additional","affiliation":[]},{"given":"L. Bolzani","family":"Poehls","sequence":"additional","affiliation":[]},{"given":"S.","family":"Hamdioui","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2002.1029769"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584047"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2018.2789818"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639732"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0840"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116278"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.07.092"},{"key":"ref17","article-title":"A BIST Scheme for Detect. Defec. in FinFET-Based SRAM Circuit","author":"chen","year":"2018","journal-title":"Asian Test Symposium"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791517"},{"key":"ref19","article-title":"Comprehensive analysis of variability sources of FinFET characteristics","author":"matsukawa","year":"2009","journal-title":"Symp on VLSI Technol"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2918768"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2016.2546199"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2017.7928960"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893615"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000134"},{"key":"ref8","article-title":"FinFET SRAM hardening through des. and technol. param. considering process var","author":"villacorta","year":"2013","journal-title":"RADECS 2013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.86"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401565"},{"key":"ref9","article-title":"A Qual. and Rel. Driven DFT and DFR Strategy for Automot. and Ind. Markets","author":"shah","year":"2019","journal-title":"VLSI Test Symp"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/365689"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843856"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386943"},{"article-title":"Probability and Stochastic Processes: A Friendly Introduction for Electrical and Computer Engineers","year":"2005","author":"yates","key":"ref21"},{"year":"2012","key":"ref24","article-title":"Predictive Technology Model (PTM)"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2007.4437418"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000029458.57095.bb"}],"event":{"name":"2021 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2021,5,24]]},"location":"Bruges, Belgium","end":{"date-parts":[[2021,5,28]]}},"container-title":["2021 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9465371\/9465372\/09465441.pdf?arnumber=9465441","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T11:45:21Z","timestamp":1652183121000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9465441\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,24]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/ets50041.2021.9465441","relation":{},"subject":[],"published":{"date-parts":[[2021,5,24]]}}}