{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:00:53Z","timestamp":1725584453478},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/ets48528.2020.9131588","type":"proceedings-article","created":{"date-parts":[[2020,7,2]],"date-time":"2020-07-02T21:06:26Z","timestamp":1593723986000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["On-chip reduced-code static linearity test of $V_{cm}$ -based switching SAR ADCs using an incremental analog-to-digital converter"],"prefix":"10.1109","author":[{"given":"Renato S.","family":"Feitoza","sequence":"first","affiliation":[]},{"given":"Manuel J.","family":"Barragan","sequence":"additional","affiliation":[]},{"given":"Antonio","family":"Gines","sequence":"additional","affiliation":[]},{"given":"Salvador","family":"Mir","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2015.2469014"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847818"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474180"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.1990.110175"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2012.11"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2019.8920377"},{"key":"ref7","first-page":"1","article-title":"Reduced-code static linearity test of split-capacitor SAR ADCs using an embedded incremental ??converter","author":"feitoza","year":"2019","journal-title":"IEEE Trans on Device and Materials Reliability"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583979"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.826202"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2242501"}],"event":{"name":"2020 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2020,5,25]]},"location":"Tallinn, Estonia","end":{"date-parts":[[2020,5,29]]}},"container-title":["2020 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125440\/9131553\/09131588.pdf?arnumber=9131588","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:53:45Z","timestamp":1656345225000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9131588\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ets48528.2020.9131588","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}