{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T08:08:24Z","timestamp":1725610104710},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,19]],"date-time":"2022-09-19T00:00:00Z","timestamp":1663545600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,19]],"date-time":"2022-09-19T00:00:00Z","timestamp":1663545600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,19]]},"DOI":"10.1109\/essderc55479.2022.9947129","type":"proceedings-article","created":{"date-parts":[[2022,11,18]],"date-time":"2022-11-18T20:49:46Z","timestamp":1668804586000},"page":"332-335","source":"Crossref","is-referenced-by-count":0,"title":["Highly robust and reliable power amplifiers in 22FDX and 45RFSOI technologies"],"prefix":"10.1109","author":[{"given":"A.","family":"Bossuet","sequence":"first","affiliation":[{"name":"CEA,Grenoble,France"}]},{"given":"A.","family":"Divay","sequence":"additional","affiliation":[{"name":"CEA,Grenoble,France"}]},{"given":"B.","family":"Martineau","sequence":"additional","affiliation":[{"name":"CEA,Grenoble,France"}]},{"given":"C.","family":"Dehos","sequence":"additional","affiliation":[{"name":"CEA,Grenoble,France"}]},{"given":"B.","family":"Blampey","sequence":"additional","affiliation":[{"name":"CEA,Grenoble,France"}]},{"given":"Y.","family":"Morandini","sequence":"additional","affiliation":[{"name":"SOITEC,Bernin,France"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IMS30576.2020.9223861"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/55.56480"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9371997"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2074951"}],"event":{"name":"ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)","start":{"date-parts":[[2022,9,19]]},"location":"Milan, Italy","end":{"date-parts":[[2022,9,22]]}},"container-title":["ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9947060\/9947094\/09947129.pdf?arnumber=9947129","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T19:56:36Z","timestamp":1670874996000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9947129\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,19]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/essderc55479.2022.9947129","relation":{},"subject":[],"published":{"date-parts":[[2022,9,19]]}}}