{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T11:31:55Z","timestamp":1725795115612},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/essderc.2018.8486879","type":"proceedings-article","created":{"date-parts":[[2018,10,18]],"date-time":"2018-10-18T18:50:05Z","timestamp":1539888605000},"page":"146-149","source":"Crossref","is-referenced-by-count":5,"title":["Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit"],"prefix":"10.1109","author":[{"given":"Simon","family":"Van Beek","sequence":"first","affiliation":[]},{"given":"Philippe","family":"Rousse","sequence":"additional","affiliation":[]},{"given":"Barry","family":"O'Sullivan","sequence":"additional","affiliation":[]},{"given":"Robin","family":"Degraeve","sequence":"additional","affiliation":[]},{"given":"Stefan","family":"Cosemans","sequence":"additional","affiliation":[]},{"given":"Dimitri","family":"Linten","sequence":"additional","affiliation":[]},{"given":"Gouri Sankar","family":"Kar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838493"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241773"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574620"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2006.877710"},{"key":"ref1","first-page":"my. 4. 1","article-title":"Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions","author":"van beek","year":"2015","journal-title":"Proc IRPS"}],"event":{"name":"48th European Solid-State Device Research Conference (ESSDERC 2018)","start":{"date-parts":[[2018,9,3]]},"location":"Dresden","end":{"date-parts":[[2018,9,6]]}},"container-title":["2018 48th European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8476153\/8486846\/08486879.pdf?arnumber=8486879","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T03:19:24Z","timestamp":1598239164000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8486879\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/essderc.2018.8486879","relation":{},"subject":[],"published":{"date-parts":[[2018,9]]}}}