{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:51:31Z","timestamp":1730220691573,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/essderc.2017.8066591","type":"proceedings-article","created":{"date-parts":[[2017,10,25]],"date-time":"2017-10-25T20:13:21Z","timestamp":1508962401000},"page":"58-61","source":"Crossref","is-referenced-by-count":28,"title":["Nanometer CMOS characterization and compact modeling at deep-cryogenic temperatures"],"prefix":"10.1109","author":[{"given":"R. M.","family":"Incandela","sequence":"first","affiliation":[]},{"given":"L.","family":"Song","sequence":"additional","affiliation":[]},{"given":"H.A.R.","family":"Homulle","sequence":"additional","affiliation":[]},{"given":"F.","family":"Sebastiano","sequence":"additional","affiliation":[]},{"given":"E.","family":"Charbon","sequence":"additional","affiliation":[]},{"given":"A.","family":"Vladimirescu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.cryogenics.2013.10.003"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.3468"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2046458"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(87)90190-0"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2014.6848614"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373497"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2037381"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/19\/12\/009"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1986.1052555"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.2000614"},{"key":"ref4","first-page":"98192","article-title":"Extraction of static parameters to extend the EKV model to cryogenic temperatures","author":"fonseca","year":"2016","journal-title":"SPIE Defense+ Security SPIE"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870362"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.12.005"},{"key":"ref6","first-page":"990","article-title":"Impact of kink effect on CMOS readout circuits for cryogenic operation","volume":"37","author":"liu","year":"2007","journal-title":"Laser & Infrared"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.2010.5874057"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/WOLTE.2014.6881018"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.01.004"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838410"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.877872"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870244"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/16.216435"},{"key":"ref22","first-page":"369","volume":"536","author":"simoen","year":"2004","journal-title":"Impact of irradiations performed at liquid helium temperatures on the operation of 0 7 ?m CMOS devices and read-out circuits"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/16.925249"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2009.5290227"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/16.81639"},{"journal-title":"PSP 102 3","year":"0","author":"li","key":"ref26"},{"journal-title":"Physical Background of MOS Model 11","year":"0","author":"langevelde","key":"ref25"}],"event":{"name":"ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)","start":{"date-parts":[[2017,9,11]]},"location":"Leuven, Belgium","end":{"date-parts":[[2017,9,14]]}},"container-title":["2017 47th European Solid-State Device Research Conference (ESSDERC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8059714\/8066575\/08066591.pdf?arnumber=8066591","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,11,30]],"date-time":"2017-11-30T21:03:46Z","timestamp":1512075826000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8066591\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/essderc.2017.8066591","relation":{},"subject":[],"published":{"date-parts":[[2017,9]]}}}