{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T09:41:32Z","timestamp":1725615692036},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1109\/dsn.2010.5544952","type":"proceedings-article","created":{"date-parts":[[2010,8,10]],"date-time":"2010-08-10T20:44:07Z","timestamp":1281473047000},"page":"131-140","source":"Crossref","is-referenced-by-count":11,"title":["A fast and accurate multi-cycle soft error rate estimation approach to resilient embedded systems design"],"prefix":"10.1109","author":[{"given":"Mahdi","family":"Fazeli","sequence":"first","affiliation":[]},{"given":"Seyed Ghassem","family":"Miremadi","sequence":"additional","affiliation":[]},{"given":"Hossein","family":"Asadi","sequence":"additional","affiliation":[]},{"given":"Seyed Nematollah","family":"Ahmadian","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Fujitsu Corporation","year":"2003","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090770"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.47"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250160"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882592"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271075"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197722"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/23.556861"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.143"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2008.4479819"},{"key":"ref4","first-page":"121.01.1","article-title":"Soft Errors in Commercial Semiconductor Technology: Overview and Scaling Trends","author":"baumann","year":"2002","journal-title":"IEEE 2002 Reliability Physics Tutorial Notes Reliability Fundamentals"},{"key":"ref3","article-title":"Soft error derating computation in sequential circuits","author":"asadi","year":"2006","journal-title":"in Proceedings of the IEEE International Conference on Computer Aided Design (ICCAD)"},{"key":"ref6","article-title":"Workshop Talk","author":"bossen","year":"2002","journal-title":"Proc Int Reliability Physics Symposium (IRPS)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2004.1283723"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676819"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465256"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.274"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.49"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.891036"},{"key":"ref22","article-title":"Symbolic simulation of the propagation and filtering of transient faulty pulses","author":"zhang","year":"2005","journal-title":"Proceedings of IEEE Workshop on Silicon Errors in Logic - System Effects"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.831993"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382553"},{"key":"ref23","doi-asserted-by":"crossref","DOI":"10.1109\/ISQED.2006.64","article-title":"Faser: Fast analysis of soft error susceptibility for cell-based designs","author":"zhang","year":"2006","journal-title":"Proc Int Symp Quality Electronic Design (ISQED)"},{"key":"ref25","first-page":"100","article-title":"Cost-effective radiation hardening technique for combinational logic","author":"zhou","year":"2004","journal-title":"in Proceedings of the IEEE International Conference on Computer Aided Design (ICCAD)"}],"event":{"name":"Networks (DSN)","start":{"date-parts":[[2010,6,28]]},"location":"Chicago, IL, USA","end":{"date-parts":[[2010,7,1]]}},"container-title":["2010 IEEE\/IFIP International Conference on Dependable Systems & Networks (DSN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5532324\/5544245\/05544952.pdf?arnumber=5544952","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T15:31:40Z","timestamp":1559403100000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5544952\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/dsn.2010.5544952","relation":{},"subject":[],"published":{"date-parts":[[2010,6]]}}}