{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T09:19:00Z","timestamp":1725614340445},"reference-count":23,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2005.68","type":"proceedings-article","created":{"date-parts":[[2006,3,30]],"date-time":"2006-03-30T14:55:04Z","timestamp":1143730504000},"page":"42-50","source":"Crossref","is-referenced-by-count":8,"title":["Using statistical transformations to improve compression for linear decompressors"],"prefix":"10.1109","author":[{"given":"S.I.","family":"Ward","sequence":"first","affiliation":[]},{"given":"C.","family":"Schattauer","sequence":"additional","affiliation":[]},{"given":"N.A.","family":"Touba","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.811452"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011118"},{"key":"ref12","first-page":"321","article-title":"Reducing Test Data Volume Using LFSR Reseeding with Seed Compression","author":"krishna","year":"2001","journal-title":"Proc of IEEE International Test Conference"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990304"},{"key":"ref14","first-page":"219","article-title":"Test Data Compression Using Dictionaries with Fixed-Length Indices","author":"li","year":"2003","journal-title":"Proc of VLSI Test Symposium"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"732","DOI":"10.1145\/775832.776020","article-title":"Test Application Time and Volume Compression through Seed Overlapping","author":"rao","year":"2003","journal-title":"Proc of Design Automation Conference"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998303"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011119"},{"key":"ref19","first-page":"944","article-title":"Combining Dictionary Coding and LFSR Reseding for Test Data Compression","author":"sun","year":"2004","journal-title":"Proc of Design Automation Conference"},{"journal-title":"Compiler A Monthly Magazine for Technologies Worldwide Synopsys","article-title":"How to Implement Deterministic Logic Built-In Self-Test (BIST)","year":"2003","author":"chandramouli","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923416"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998363"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743186"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JRPROC.1952.273898"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843834"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387358"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766654"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041756"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041776"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387356"},{"key":"ref23","first-page":"926","article-title":"Data Compression for Multiple Scan Chains Using Dictionaries with Corrections","author":"w\u00fcrtenberger","year":"2004","journal-title":"Proc of International Test Conference"}],"event":{"name":"20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","acronym":"DFTVS-05","location":"Monterey, CA, USA"},"container-title":["20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10366\/32969\/01544502.pdf?arnumber=1544502","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,7,25]],"date-time":"2021-07-25T07:49:31Z","timestamp":1627199371000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1544502\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2005.68","relation":{},"subject":[]}}