{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T23:37:02Z","timestamp":1725406622271},"reference-count":8,"publisher":"IEEE Comput. Soc. Press","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.1996.572012","type":"proceedings-article","created":{"date-parts":[[2002,12,23]],"date-time":"2002-12-23T22:15:25Z","timestamp":1040681725000},"page":"131-139","source":"Crossref","is-referenced-by-count":10,"title":["A statistical parametric and probe yield analysis methodology [IC manufacture]"],"prefix":"10.1109","author":[{"given":"A.Y.","family":"Wong","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-6799-8_9"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MCD.1987.6323237"},{"key":"ref6","article-title":"Kerf Test Structure Designs for Process and Device Characterization","author":"alcorn","year":"1985","journal-title":"Solid State Technology"},{"key":"ref5","article-title":"Defect Test Structures for Characterization of VLSI Technologies","author":"mitchell","year":"1985","journal-title":"Solid State Technology"},{"year":"0","key":"ref8"},{"journal-title":"Understanding Robust and Exploratory Data Analysis","year":"1983","author":"hoaglin","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.1995.496380"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1983.12619"}],"event":{"name":"Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","acronym":"DFTVS-96","location":"Boston, MA, USA"},"container-title":["Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx3\/4201\/12360\/00572012.pdf?arnumber=572012","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,9]],"date-time":"2017-03-09T18:54:29Z","timestamp":1489085669000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/572012\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/dftvs.1996.572012","relation":{},"subject":[]}}