{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T16:03:46Z","timestamp":1725811426426},"reference-count":2,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,9]]},"DOI":"10.1109\/dft.2007.59","type":"proceedings-article","created":{"date-parts":[[2008,7,30]],"date-time":"2008-07-30T16:45:20Z","timestamp":1217436320000},"page":"526-534","source":"Crossref","is-referenced-by-count":24,"title":["Quantitative Analysis of In-Field Defects in Image Sensor Arrays"],"prefix":"10.1109","author":[{"given":"Jenny","family":"Leung","sequence":"first","affiliation":[]},{"given":"Jozsef","family":"Dudas","sequence":"additional","affiliation":[]},{"given":"Glenn H.","family":"Chapman","sequence":"additional","affiliation":[]},{"given":"Israel","family":"Koren","sequence":"additional","affiliation":[]},{"given":"Zahava","family":"Koren","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"2","doi-asserted-by":"crossref","DOI":"10.1117\/12.704563","article-title":"Identification of in-field defect development in digital image sensors","author":"dudas","year":"2007","journal-title":"Proc SPIE 6502"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2005.1609479"}],"event":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","start":{"date-parts":[[2007,9,26]]},"location":"Rome, Italy","end":{"date-parts":[[2007,9,28]]}},"container-title":["22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4358358\/4358359\/04358422.pdf?arnumber=4358422","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T06:30:05Z","timestamp":1497767405000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4358422\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,9]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/dft.2007.59","relation":{},"subject":[],"published":{"date-parts":[[2007,9]]}}}