{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T19:49:04Z","timestamp":1725652144485},"reference-count":41,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,4]]},"DOI":"10.1109\/ddecs.2014.6868778","type":"proceedings-article","created":{"date-parts":[[2014,8,8]],"date-time":"2014-08-08T18:34:40Z","timestamp":1407522880000},"page":"141-146","source":"Crossref","is-referenced-by-count":4,"title":["Online testing of many-core systems in the Dark Silicon era"],"prefix":"10.1109","author":[{"given":"Mohammad-Hashem","family":"Haghbayan","sequence":"first","affiliation":[]},{"given":"Amir-Mohammad","family":"Rahmani","sequence":"additional","affiliation":[]},{"given":"Pasi","family":"Liljeberg","sequence":"additional","affiliation":[]},{"given":"Juha","family":"Plosila","sequence":"additional","affiliation":[]},{"given":"Hannu","family":"Tenhunen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"article-title":"Dark vs. Dim Silicon and Near-Threshold Computing Extended Results","year":"2012","author":"wang","key":"ref39"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488782"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2036184"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147014"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"209","DOI":"10.1109\/DDECS.2012.6219059","article-title":"Effective RT-level software-based self-testing of embedded processor cores","author":"kabiri","year":"2012","journal-title":"Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits Systems (DDECS)"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219022"},{"key":"ref36","first-page":"74","article-title":"Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm","author":"yu","year":"2002","journal-title":"Procedeeings of the International Test Conference"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2005.63"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2006.65"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"journal-title":"Digital System Test and Testable Design Using HDL Models and Architectures","year":"2010","author":"navabi","key":"ref40"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/L-CA.2004.1"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.55"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.1268400"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090627"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/NOCS.2010.12"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763112"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2013711"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2013.74"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488949"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.68"},{"article-title":"International technology roadmap for semiconductors (ITRS), 2011 edition","year":"2011","author":"association","key":"ref4"},{"key":"ref27","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4020-2801-4","author":"gizopoulos","year":"2004","journal-title":"Embedded Processor-Based Self-Test"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.910957"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1974.1050511"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/43.913755"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2012.17"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2408776.2408797"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"1131","DOI":"10.1145\/2228360.2228567","article-title":"Is dark silicon useful? Harnessing the four horsemen of the coming dark silicon apocalypse","author":"taylor","year":"2012","journal-title":"Proceedings of 49th ACM\/EDAC\/ IEEE Design Automation Conference"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2007.4378780"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2004.24"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5434077"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2011.18"},{"year":"0","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2012.48"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2011.77"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.85"},{"journal-title":"White Paper 2011","article-title":"Variable SMP: A multi-core cpu architecture for low power and high performance","year":"0","key":"ref23"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.95"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1999946.1999965"}],"event":{"name":"2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2014,4,23]]},"location":"Warsaw, Poland","end":{"date-parts":[[2014,4,25]]}},"container-title":["17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6862738\/6868744\/06868778.pdf?arnumber=6868778","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,14]],"date-time":"2022-04-14T01:29:05Z","timestamp":1649899745000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6868778\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,4]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2014.6868778","relation":{},"subject":[],"published":{"date-parts":[[2014,4]]}}}