{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T14:44:05Z","timestamp":1725806645618},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,4]]},"DOI":"10.1109\/date.2009.5090777","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:39Z","timestamp":1361279799000},"page":"827-832","source":"Crossref","is-referenced-by-count":15,"title":["Gate sizing for large cell-based designs"],"prefix":"10.1109","author":[{"given":"S.","family":"Held","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"17","first-page":"111","article-title":"gate sizing by lagrangian relaxation revisited. proc","author":"wang","year":"2007","journal-title":"ICCAD"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.884166"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/43.998628"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/43.248073"},{"key":"14","first-page":"315","author":"singh","year":"2005","journal-title":"Robust gate sizing by geometric programming Proc"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.917960"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2004.1283660"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/43.771182"},{"year":"0","key":"2"},{"key":"1","first-page":"321","author":"agarwal","year":"2005","journal-title":"Circuit optimization using statistical static timing analysis Proc"},{"key":"10","first-page":"847","author":"hu","year":"2007","journal-title":"Gate Sizing For Cell Library-Based Designs Proc"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.873901"},{"year":"0","key":"6"},{"year":"0","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9260(06)80015-5"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1147\/rd.261.0100"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9260(06)80013-1"}],"event":{"name":"2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09)","start":{"date-parts":[[2009,4,20]]},"location":"Nice","end":{"date-parts":[[2009,4,24]]}},"container-title":["2009 Design, Automation & Test in Europe Conference & Exhibition"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4926138\/5090609\/05090777.pdf?arnumber=5090777","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T00:22:53Z","timestamp":1489796573000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5090777\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,4]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/date.2009.5090777","relation":{},"subject":[],"published":{"date-parts":[[2009,4]]}}}