{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T12:53:09Z","timestamp":1730206389255,"version":"3.28.0"},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/cicc.2005.1568655","type":"proceedings-article","created":{"date-parts":[[2006,1,18]],"date-time":"2006-01-18T18:42:54Z","timestamp":1137609774000},"page":"252-255","source":"Crossref","is-referenced-by-count":1,"title":["An embedded non-volatile FRAM with electrical fuse repair scheme and one time programming scheme for high performance smart cards"],"prefix":"10.1109","author":[{"family":"Byung-Jun Min","sequence":"first","affiliation":[]},{"family":"Kang-Woon Lee","sequence":"additional","affiliation":[]},{"family":"Han-Ju Lee","sequence":"additional","affiliation":[]},{"family":"So-Ra Kim","sequence":"additional","affiliation":[]},{"family":"Seung-Gyu Oh","sequence":"additional","affiliation":[]},{"family":"Byung-Gil Jeon","sequence":"additional","affiliation":[]},{"family":"Hee-Hyun Yang","sequence":"additional","affiliation":[]},{"family":"Min-Kyu Kim","sequence":"additional","affiliation":[]},{"family":"Sung-Hee Cho","sequence":"additional","affiliation":[]},{"family":"Honsik Cheong","sequence":"additional","affiliation":[]},{"family":"Chilhee Chung","sequence":"additional","affiliation":[]},{"family":"Kinam Kim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041759"},{"key":"2","first-page":"523","article-title":"Electrically Programmable Fuse (eFUSE) Using Electromigration in Suicides, Electron Device Letters","volume":"23","author":"kothandaraman","year":"2002","journal-title":"IEEE"},{"year":"0","key":"1"}],"event":{"name":"IEEE 2005 Custom Integrated Circuits Conference, 2005.","location":"San Jose, CA, USA"},"container-title":["Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10489\/33245\/01568655.pdf?arnumber=1568655","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T12:08:13Z","timestamp":1489493293000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1568655\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/cicc.2005.1568655","relation":{},"subject":[]}}