{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T01:59:27Z","timestamp":1725501567606},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/ats.2012.71","type":"proceedings-article","created":{"date-parts":[[2013,1,7]],"date-time":"2013-01-07T19:08:46Z","timestamp":1357585726000},"page":"69-69","source":"Crossref","is-referenced-by-count":0,"title":["In-Field Testing of NAND Flash Storage: Why and How?"],"prefix":"10.1109","author":[{"given":"Yu","family":"Hu","sequence":"first","affiliation":[]},{"given":"Xinli","family":"Gu","sequence":"additional","affiliation":[]},{"given":"Xiaowei","family":"Li","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"521","article-title":"Error patterns in MLC nand flash memory: Measurement, characterization, and analysis","author":"cai","year":"2012","journal-title":"Proc of DATE"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.885828"},{"key":"1","first-page":"218","article-title":"Flash memory disturbances: Modeling and test","author":"mohammad","year":"2001","journal-title":"Proc of VTS"}],"event":{"name":"2012 21st Asian Test Symposium (ATS)","start":{"date-parts":[[2012,11,19]]},"location":"Niigata, Japan","end":{"date-parts":[[2012,11,22]]}},"container-title":["2012 IEEE 21st Asian Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6392591\/6394156\/06394176.pdf?arnumber=6394176","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T16:38:44Z","timestamp":1490200724000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6394176\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/ats.2012.71","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}