{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:38:29Z","timestamp":1729665509756,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/ast.2017.5","type":"proceedings-article","created":{"date-parts":[[2017,7,3]],"date-time":"2017-07-03T20:41:00Z","timestamp":1499114460000},"page":"45-51","source":"Crossref","is-referenced-by-count":1,"title":["DATm: Diderot's Automated Testing Model"],"prefix":"10.1109","author":[{"given":"Charisee","family":"Chiw","sequence":"first","affiliation":[]},{"given":"Gordon","family":"Kindlmann","sequence":"additional","affiliation":[]},{"given":"John","family":"Reppy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MET.2016.016"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2364506.2364515"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVCG.2009.194"},{"key":"ref13","article-title":"Test Set Diameter: Quantifying the Diversity of Sets of Test Cases","author":"feldt","year":"2015","journal-title":"ArXiv e-prints"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVCG.2015.2467449"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"216","DOI":"10.1145\/2594291.2594334","article-title":"Compiler validation via equivalence modulo inputs","author":"le","year":"2014","journal-title":"ACM SIGPLAN'97 Conf on Programming Language Design and Implementation PLDI"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1085130.1085132"},{"key":"ref17","first-page":"100","article-title":"Differential testing for software","volume":"10","author":"mckeeman","year":"1998","journal-title":"Digital Technical Journal"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1982595.1982615"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2896921.2896922"},{"journal-title":"Ein notation in the diderot compiler","year":"0","author":"chiw","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884878"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2254064.2254079"},{"key":"ref5","article-title":"EIN: An intermediate representation for compiling tensor calculus","author":"charisee","year":"2016","journal-title":"Proceedings of the 19th Workshop on Compilers for Parallel Computing (CPC 2019)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/351240.351266"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-78969-7_23"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-11957-6_8"},{"year":"0","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cma.2004.03.002"},{"journal-title":"Sympy is a python library","year":"0","key":"ref20"},{"journal-title":"Teem Library","year":"0","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2010.39"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-03034-5_7"},{"key":"ref23","volume":"7","author":"silva","year":"2015","journal-title":"An Introduction to Verification of Visualization Techniques"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1993316.1993532"}],"event":{"name":"2017 IEEE\/ACM 12th International Workshop on Automation of Software Testing (AST)","start":{"date-parts":[[2017,5,20]]},"location":"Buenos Aires, Argentina","end":{"date-parts":[[2017,5,21]]}},"container-title":["2017 IEEE\/ACM 12th International Workshop on Automation of Software Testing (AST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7959758\/7962314\/07962331.pdf?arnumber=7962331","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,30]],"date-time":"2022-07-30T10:58:00Z","timestamp":1659178680000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7962331\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/ast.2017.5","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}