{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,19]],"date-time":"2024-07-19T06:34:14Z","timestamp":1721370854561},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3220891","type":"journal-article","created":{"date-parts":[[2022,11,9]],"date-time":"2022-11-09T20:39:08Z","timestamp":1668026348000},"page":"118000-118011","source":"Crossref","is-referenced-by-count":1,"title":["Acquisition of Time and Doppler Shift in WFRFT Encrypted Chaotic Direct Sequence Spread Spectrum System"],"prefix":"10.1109","volume":"10","author":[{"given":"Jiangyan","family":"He","sequence":"first","affiliation":[{"name":"Department of UAV Engineering, Shijiazhuang Campus, Army Engineering University of PLA, Shijiazhuang, China"}]},{"ORCID":"http:\/\/orcid.org\/0000-0002-5189-9146","authenticated-orcid":false,"given":"Guogang","family":"Yuan","sequence":"additional","affiliation":[{"name":"Department of UAV Engineering, Shijiazhuang Campus, Army Engineering University of PLA, Shijiazhuang, China"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-4366-9874","authenticated-orcid":false,"given":"Zili","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of UAV Engineering, Shijiazhuang Campus, Army Engineering University of PLA, Shijiazhuang, China"}]},{"given":"Xijun","family":"Gao","sequence":"additional","affiliation":[{"name":"Department of UAV Engineering, Shijiazhuang Campus, Army Engineering University of PLA, Shijiazhuang, China"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/s18061717"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2909787"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/app12126255"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8080829"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10291-018-0768-0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2014.2366719"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2020.107646"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3031906"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2020.2967760"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2020.3036805"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2017.2700267"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2020.153131"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CC.2016.7582295"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2021.3096388"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2019.2943608"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2935038"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/iet-spr.2016.0687"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2016.2572730"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2900279"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/JCC.2020.01.010"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2011.092011.090171"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CC.2015.7275261"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICCC49849.2020.9238805"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1111\/sapm.12050"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09943529.pdf?arnumber=9943529","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,12]],"date-time":"2022-12-12T20:00:45Z","timestamp":1670875245000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9943529\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3220891","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}