{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,4,6]],"date-time":"2024-04-06T06:00:43Z","timestamp":1712383243671},"reference-count":107,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100004488","name":"Croatian Science Foundation through the Reliable Composite Applications Based on Web Services","doi-asserted-by":"publisher","award":["HRZZ-IP-01-2018-6423"],"id":[{"id":"10.13039\/501100004488","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100008530","name":"European Regional Development Fund","doi-asserted-by":"publisher","award":["KK.01.2.1.01.0111 (OperOSS)"],"id":[{"id":"10.13039\/501100008530","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3054948","type":"journal-article","created":{"date-parts":[[2021,1,27]],"date-time":"2021-01-27T20:48:43Z","timestamp":1611780523000},"page":"19391-19411","source":"Crossref","is-referenced-by-count":11,"title":["Improving Software Defect Prediction by Aggregated Change Metrics"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"http:\/\/orcid.org\/0000-0002-8011-1055","authenticated-orcid":false,"given":"Lucija","family":"Sikic","sequence":"first","affiliation":[]},{"ORCID":"http:\/\/orcid.org\/0000-0001-9270-5988","authenticated-orcid":false,"given":"Petar","family":"Afric","sequence":"additional","affiliation":[]},{"ORCID":"http:\/\/orcid.org\/0000-0003-2313-0396","authenticated-orcid":false,"given":"Adrian Satja","family":"Kurdija","sequence":"additional","affiliation":[]},{"ORCID":"http:\/\/orcid.org\/0000-0002-4896-7689","authenticated-orcid":false,"given":"Marin","family":"Silic","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","author":"kan","year":"2002","journal-title":"Metrics and Models in Software Quality Engineering"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2014.04.019"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/app9102138"},{"key":"ref32","article-title":"Survey on software defect prediction","author":"nam","year":"2014"},{"key":"ref31","article-title":"Revisiting process versus product metrics: A large scale analysis","author":"majumder","year":"2020","journal-title":"arXiv 2008 09569"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2013.02.009"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ITNEC48623.2020.9084745"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1155\/2019\/6230953"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2925313"},{"key":"ref34","article-title":"A deep tree-based model for software defect prediction","author":"dam","year":"2018","journal-title":"arXiv 1802 00921"},{"key":"ref28","article-title":"Static code metrics vs. Process metrics for software fault prediction using Bayesian network learners","author":"stanic","year":"2015"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0211359"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/32.859533"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICACTE.2008.204"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233837"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.07.040"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/app10134624"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/32.295895"},{"key":"ref101","doi-asserted-by":"publisher","DOI":"10.1007\/s11135-006-9018-6"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985859"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2009.13"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/32.689404"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/EUROMICRO.2007.20"},{"key":"ref51","article-title":"The impact of feature selection on predicting the number of bugs","author":"osman","year":"2018","journal-title":"arXiv 1807 04486"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.3390\/sym11020212"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1145\/1868328.1868330"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2019.00014"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1088\/1757-899X\/394\/3\/032035"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1002\/spe.1043"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1145\/2723742.2723754"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/MALTESQUE.2017.7882013"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.05.035"},{"key":"ref40","author":"frank","year":"1994","journal-title":"The Data Analysis Handbook"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884804"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-012-9218-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2018.02.043"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-014-9241-7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksuci.2019.03.006"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.jbi.2017.11.005"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368114"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2015.14"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2019.2891758"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME.2018.00018"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ICDMW.2009.78"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLA.2009.18"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.12.794"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/S1088-467X(97)00008-5"},{"key":"ref44","first-page":"417","article-title":"Robust prediction of fault-proneness by random forests","author":"guo","year":"2004","journal-title":"Proc 15th Int Symp Softw Rel Eng"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/PROMISE.2007.10"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/QSIC.2012.19"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1145\/2695664.2695959"},{"key":"ref71","first-page":"38","article-title":"Absolute correlation weighted naïve Bayes for software defect prediction","volume":"1","author":"asmono","year":"2015","journal-title":"J Softw Eng"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1016\/j.datak.2008.10.005"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2010.5596650"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2994528"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025156"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2005.149"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1145\/1868328.1868357"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1145\/1868328.1868356"},{"key":"ref60","first-page":"285","article-title":"Software defect prediction using artificial immune recognition system","author":"catal","year":"2007","journal-title":"Proc 25th Conf IASTED Int Multi-Conf Softw Eng"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2010.11.013"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/DEPCOS-RELCOMEX.2007.8"},{"key":"ref63","first-page":"14291","article-title":"Software defect prediction using ant colony optimization","volume":"13","author":"kumar","year":"2018","journal-title":"Int J Appl Eng Res"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.4018\/IJOSSP.2017100102"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2015.08.454"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1145\/581339.581371"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/METRIC.2002.1011339"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008699112516"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2017.42"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2720603"},{"key":"ref1","article-title":"Cross-project defect prediction with meta-learning","author":"porto","year":"2017"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.06.055"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2009.5070510"},{"key":"ref107","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2015.02.161"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2009.11.010"},{"key":"ref106","doi-asserted-by":"publisher","DOI":"10.1213\/ANE.0000000000002864"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606589"},{"key":"ref105","doi-asserted-by":"publisher","DOI":"10.1002\/bltj.2229"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2018.8330212"},{"key":"ref104","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009896203228"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-008-9053-8"},{"key":"ref103","author":"evans","year":"1996","journal-title":"Straightforward Statistics for the Behavioral Sciences"},{"key":"ref102","first-page":"2","article-title":"Predictive accuracy: A misleading performance measure for highly imbalanced data","volume":"12","author":"akosa","year":"2017","journal-title":"Proc SAS Global Forum"},{"key":"ref98","author":"g\u00e9ron","year":"2019","journal-title":"Hands-On Machine Learning with Scikit-Learn Keras and TensorFlow Concepts Tools and Techniques to Build Intelligent Systems"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624884"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2803183"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-016-9353-3"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.70"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2016.193"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICSESS.2014.6933517"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SEAA.2008.36"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-010-0069-5"},{"key":"ref15","article-title":"Exploiting abstract syntax trees to locate software defects","author":"shippey","year":"2015"},{"key":"ref16","author":"halstead","year":"1977","journal-title":"Elements of Software Science"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1145\/1985441.1985464"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10586-018-1696-z"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.81"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2015.04.045"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-011-9178-4"},{"key":"ref19","first-page":"417","article-title":"Robust prediction of fault-proneness by random forests","author":"guo","year":"2004","journal-title":"Proc 15th Int Symp Softw Rel Eng"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985860"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.103"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.70773"},{"key":"ref85","first-page":"72","article-title":"Periodic developer metrics in software defect prediction","author":"kini","year":"2018","journal-title":"Proc IEEE 18th Int Work Conf Source Code Anal Manipulation (SCAM)"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1145\/2020390.2020392"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.25"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2006.05.034"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09336678.pdf?arnumber=9336678","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:56:28Z","timestamp":1639770988000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9336678\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":107,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3054948","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}