{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,17]],"date-time":"2025-04-17T07:29:20Z","timestamp":1744874960427,"version":"3.37.3"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61774052"],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Science and Technology on Analog Integrated Circuit Laboratory","award":["6142802180507"]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2964948","type":"journal-article","created":{"date-parts":[[2020,1,8]],"date-time":"2020-01-08T21:08:54Z","timestamp":1578517734000},"page":"12445-12451","source":"Crossref","is-referenced-by-count":15,"title":["An SEB Hardened AlGaN\/GaN HEMT With Barrier Interlayer"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5964-1740","authenticated-orcid":false,"given":"Fei","family":"Zhang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1123-369X","authenticated-orcid":false,"given":"Ying","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Xue","family":"Wu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8089-3416","authenticated-orcid":false,"given":"Fei","family":"Cao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2009.2039026"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2019.8720465"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2014.6856025"},{"journal-title":"Sentaurus Device User Guide Version I-2013 12","year":"2013","key":"ref32"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1063\/1.3492841"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.51.04DF04"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2914674"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2015.7336720"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1142\/S0129156403001612"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.880945"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2593791"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2781697"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1063\/1.2005379"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.113493"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2014.2331001"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2365545"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2819990"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2710629"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2451075"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2887245"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2782227"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/23.273458"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2014.7004594"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/16.822272"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2017.57"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.825077"},{"key":"ref13","first-page":"3060","article-title":"Process dependence of proton-induced degradation in GaN HEMTs","volume":"57","author":"roy","year":"2010","journal-title":"IEEE Trans Nucl Sci"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2170433"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11837-015-1359-y"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2374178"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1674-1056\/24\/5\/056103"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2626962"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2007.5205553"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2222889"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2780273"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.06.139"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2289373"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2171504"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.09.017"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1063\/1.1784520"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2272331"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2006841"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/s11664-017-5540-7"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2044808"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/55.806100"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2089493"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2019.2916846"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.2006891"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2923085"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/08952693.pdf?arnumber=8952693","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T15:56:05Z","timestamp":1642002965000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8952693\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":49,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2964948","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2020]]}}}