none
10.1049/ic.2017.0040
Institution of Engineering and Technology (IET)
Institution of Engineering and Technology (IET)
265
98609811
3050052
201805222011400000
10.1049
2018-12-06T18:51:16Z
2018-05-22T20:11:50Z
22
8th International Conference on Imaging for Crime Detection and Prevention (ICDP 2017)
Madrid, Spain
13-15 Dec. 2017
8th International Conference on Imaging for Crime Detection and Prevention (ICDP 2017)
Institution of Engineering and Technology
2017
978-1-78561-687-7
S.
Bouindour
M.M.
Hittawe
S.
Mahfouz
H.
Snoussi
Abnormal Event Detection Using Convolutional Neural Networks and 1-Class SVM classifier
2017
1
6
10.1049/ic.2017.0040
https://digital-library.theiet.org/content/conferences/10.1049/ic.2017.0040
-
http://digital-library.theiet.org/content/conferences/10.1049/ic.2017.0040?crawler=true
-
https://ieeexplore.ieee.org/document/8372163