{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,8]],"date-time":"2024-08-08T23:13:53Z","timestamp":1723158833265},"reference-count":37,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Reliability Engineering & System Safety"],"published-print":{"date-parts":[[2015,1]]},"DOI":"10.1016\/j.ress.2014.09.015","type":"journal-article","created":{"date-parts":[[2014,9,16]],"date-time":"2014-09-16T06:21:52Z","timestamp":1410848512000},"page":"192-202","update-policy":"http:\/\/dx.doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":28,"special_numbering":"C","title":["An analytical model of electronic fault diagnosis on extension of the dependency theory"],"prefix":"10.1016","volume":"133","author":[{"given":"Yiqian","family":"Cui","sequence":"first","affiliation":[]},{"given":"Junyou","family":"Shi","sequence":"additional","affiliation":[]},{"given":"Zili","family":"Wang","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/j.ress.2014.09.015_bib1","doi-asserted-by":"crossref","first-page":"1345","DOI":"10.1016\/j.ress.2006.11.005","article-title":"Reliability assessment of reliquefaction systems on LNG carriers","volume":"93","author":"Kwang Pil","year":"2008","journal-title":"Reliab Eng Syst Safe"},{"key":"10.1016\/j.ress.2014.09.015_bib2","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1016\/S0951-8320(01)00053-9","article-title":"The effects of presenting functionally abstracted information in fault diagnosis tasks","volume":"73","author":"Ham","year":"2001","journal-title":"Reliab Eng Syst Saf"},{"key":"10.1016\/j.ress.2014.09.015_bib3","doi-asserted-by":"crossref","first-page":"287","DOI":"10.1109\/TR.2010.2046772","article-title":"Analytic confusion matrix bounds for fault detection and isolation using a sum-of-squared-residuals approach","volume":"59","author":"Simon","year":"2010","journal-title":"IEEE T Reliab"},{"key":"10.1016\/j.ress.2014.09.015_bib4","doi-asserted-by":"crossref","unstructured":"Singh S, Holland SW, Bandyopadhyay P. Trends in the development of system-level fault dependency matrices. Aerospace conference, 2010 IEEE2010. p. 1-9.","DOI":"10.1109\/AERO.2010.5446825"},{"key":"10.1016\/j.ress.2014.09.015_bib5","doi-asserted-by":"crossref","first-page":"721","DOI":"10.1016\/S1383-7621(99)00041-7","article-title":"Testing and built-in self-test \u2013 A survey","volume":"46","author":"Steininger","year":"2000","journal-title":"J Syst Architect"},{"key":"10.1016\/j.ress.2014.09.015_bib6","doi-asserted-by":"crossref","first-page":"73","DOI":"10.1177\/0954406211412017","article-title":"A study of function-based diagnosis strategy and testability analysis for a system","volume":"226","author":"Tsai","year":"2012","journal-title":"P I Mech Eng C-J Mec"},{"key":"10.1016\/j.ress.2014.09.015_bib7","unstructured":"DePaul Jr R. Logic modeling as a tool for testability. AUTOTESTCON\u05f385 symposium proceedings1985. p. 203-07."},{"key":"10.1016\/j.ress.2014.09.015_bib8","doi-asserted-by":"crossref","first-page":"14","DOI":"10.1109\/62.373993","article-title":"Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis","volume":"10","author":"Deb","year":"1995","journal-title":"IEEE Aero El Sys Mag"},{"key":"10.1016\/j.ress.2014.09.015_bib9","unstructured":"Sheppard JW. Maintaining diagnostic truth with information flow models. AUTOTESTCON \u05f396, test technology and commercialization conference record1996. p. 447-54."},{"key":"10.1016\/j.ress.2014.09.015_bib10","series-title":"Optimum sensor localization\/selection in a diagnostic\/prognostic architecture","author":"Zhang","year":"2005"},{"key":"10.1016\/j.ress.2014.09.015_bib11","doi-asserted-by":"crossref","unstructured":"Strasser S, Sheppard J, Schuh M, Angryk R, Izurieta C. Graph-based ontology-guided data mining for D-matrix model maturation. Aerospace conference, 2011 IEEE2011. p. 1-12.","DOI":"10.1109\/AERO.2011.5747579"},{"key":"10.1016\/j.ress.2014.09.015_bib12","doi-asserted-by":"crossref","first-page":"309","DOI":"10.1007\/s10836-006-0628-7","article-title":"A formal analysis of fault diagnosis with D-Matrices","volume":"23","author":"Sheppard","year":"2007","journal-title":"J Electron Test"},{"key":"10.1016\/j.ress.2014.09.015_bib13","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1109\/ICC.2009.5199249","article-title":"A method for optimum test point selection and fault diagnosis strategy for BIT of avionic system. Testing and diagnosis","author":"Dong","year":"2009","journal-title":"ICTD 2009 IEEE circuits and systems international conference on 2009"},{"key":"10.1016\/j.ress.2014.09.015_bib14","unstructured":"Feng-wu W, Jun-you S, Lu W. Method of diagnostic tree design for system-level faults based on dependency matrix and fault tree. Industrial Engineering and Engineering Management (IE&EM), 2011 IEEE 18Th international conference on2011. p. 1113-117."},{"key":"10.1016\/j.ress.2014.09.015_bib15","doi-asserted-by":"crossref","first-page":"311","DOI":"10.1016\/j.dam.2004.08.008","article-title":"On sequential diagnosis of multiprocessor systems","volume":"146","author":"Yamada","year":"2005","journal-title":"Discrete Appl Math"},{"key":"10.1016\/j.ress.2014.09.015_bib16","doi-asserted-by":"crossref","first-page":"1154","DOI":"10.1109\/TPWRD.2003.822537","article-title":"A dependency model-based approach for identifying and evaluating power quality problems","volume":"19","author":"Azam","year":"2004","journal-title":"IEEE T Power Deliver"},{"key":"10.1016\/j.ress.2014.09.015_bib17","doi-asserted-by":"crossref","unstructured":"Temple G, Jize N, Wysocki P. Testability modeling and analysis of a rocket engine test stand. Aerospace conference, 2005 IEEE2005. p. 3874-895.","DOI":"10.1109\/AERO.2005.1559694"},{"key":"10.1016\/j.ress.2014.09.015_bib18","unstructured":"Qualtech Systems Inc., \u3008http:\/\/www.teamqsi.com\u3009."},{"key":"10.1016\/j.ress.2014.09.015_bib19","unstructured":"DSI International Inc., \u3008http:\/\/www.dsiintl.com\/\u3009."},{"key":"10.1016\/j.ress.2014.09.015_bib20","unstructured":"Committee IsC. IEEE Std 1232-2002 IEEE standard for artificial intelligence exchange and service tie to all test environments (AI\u2014ESTATE) r S. USA: IEEE 2002. 2002."},{"key":"10.1016\/j.ress.2014.09.015_bib21","unstructured":"Committee IsC. IEEE Std 1522-2004 standard for testability and diagnosability characteristics and metrics. 2005:0_1-35."},{"key":"10.1016\/j.ress.2014.09.015_bib22","doi-asserted-by":"crossref","first-page":"509","DOI":"10.2478\/v10178-012-0044-5","article-title":"A key metric and its calculation models for a continuous diagnosis capability base dependency matrix","volume":"19","author":"Shi","year":"2012","journal-title":"Metrology Meas Syst"},{"key":"10.1016\/j.ress.2014.09.015_bib23","unstructured":"Junyou S, Xiegui L, Kaiyue L. A method for searching and evaluating diagnosable sequence fault sets of a dependency matrix. Prognostics and System Health Management (PHM), 2012 IEEE conference on2012. p. 1-7."},{"key":"10.1016\/j.ress.2014.09.015_bib24","doi-asserted-by":"crossref","first-page":"1210","DOI":"10.1016\/j.ress.2010.06.014","article-title":"Combinatorial analysis of systems with competing failures subject to failure isolation and propagation effects","volume":"95","author":"Xing","year":"2010","journal-title":"Reliab Eng Syst Safe"},{"key":"10.1016\/j.ress.2014.09.015_bib25","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1016\/j.ress.2012.10.001","article-title":"Reliability analysis of multi-trigger binary systems subject to competing failures","volume":"111","author":"Wang","year":"2013","journal-title":"Reliab Eng Syst Safe"},{"key":"10.1016\/j.ress.2014.09.015_bib26","doi-asserted-by":"crossref","first-page":"2123","DOI":"10.1016\/j.jss.2011.05.060","article-title":"Evaluating the impacts of dynamic reconfiguration on the QoS of running systems","volume":"84","author":"Li","year":"2011","journal-title":"J Syst Softw"},{"key":"10.1016\/j.ress.2014.09.015_bib27","doi-asserted-by":"crossref","first-page":"95","DOI":"10.1016\/j.entcs.2010.05.006","article-title":"A formal framework for structural reconfiguration of components under behavioural adaptation","volume":"263","author":"Cansado","year":"2010","journal-title":"Electron Notes Theor Comput"},{"key":"10.1016\/j.ress.2014.09.015_bib28","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1016\/j.entcs.2009.12.033","article-title":"Correct execution of reconfiguration for stateful components","volume":"260","author":"Hammer","year":"2010","journal-title":"Electron Notes Theor Comput"},{"key":"10.1016\/j.ress.2014.09.015_bib29","doi-asserted-by":"crossref","first-page":"262","DOI":"10.1016\/S1000-9361(11)60386-5","article-title":"Sensor optimization selection model based on testability constraint","volume":"25","author":"Yang","year":"2012","journal-title":"Chinese J Aeronaut"},{"key":"10.1016\/j.ress.2014.09.015_bib30","doi-asserted-by":"crossref","first-page":"1483","DOI":"10.1016\/j.ymssp.2005.09.012","article-title":"A review on machinery diagnostics and prognostics implementing condition-based maintenance","volume":"20","author":"Jardine","year":"2006","journal-title":"Mech Syst Signal Pr"},{"key":"10.1016\/j.ress.2014.09.015_bib31","doi-asserted-by":"crossref","first-page":"49","DOI":"10.1007\/s10836-006-6593-3","article-title":"Optimization of test\/diagnosis\/rework location (s) and characteristics in electronic system assembly","volume":"22","author":"Shi","year":"2006","journal-title":"J Electron Test"},{"key":"10.1016\/j.ress.2014.09.015_bib32","doi-asserted-by":"crossref","first-page":"555","DOI":"10.1109\/ICCSIT.2009.5234888","article-title":"Support Vector Regression and Particle Swarm Optimization Algorithm for Intelligent Electronic Circuit Fault Diagnosis","volume":"1","author":"Tian","year":"2009","journal-title":"2009 2nd Ieee International Conference on Computer Science and Information Technology"},{"key":"10.1016\/j.ress.2014.09.015_bib33","doi-asserted-by":"crossref","first-page":"1393","DOI":"10.1109\/TPWRD.2010.2048344","article-title":"An analytic model for fault diagnosis in power systems considering malfunctions of protective relays and circuit breakers","volume":"25","author":"Wenxin","year":"2010","journal-title":"IEEE T Power Deliver"},{"key":"10.1016\/j.ress.2014.09.015_bib34","first-page":"473","article-title":"Optimal and near-optimal algorithms for multiple fault diagnosis with unreliable tests. AUTOTESTCON \u05f396","author":"Shakeri","year":"1996","journal-title":"test technology and commercialization conference record"},{"key":"10.1016\/j.ress.2014.09.015_bib35","doi-asserted-by":"crossref","first-page":"160","DOI":"10.1109\/TSMCA.2008.2007986","article-title":"Dynamic multiple fault diagnosis: mathematical formulations and solution techniques","volume":"39","author":"Singh","year":"2009","journal-title":"IEEE T Syst Man Cy A"},{"key":"10.1016\/j.ress.2014.09.015_bib36","doi-asserted-by":"crossref","first-page":"1224","DOI":"10.1109\/TSMCA.2009.2025572","article-title":"Dynamic multiple-fault diagnosis with imperfect tests","volume":"39","author":"Sui","year":"2009","journal-title":"IEEE T Syst Man Cy A"},{"key":"10.1016\/j.ress.2014.09.015_bib37","unstructured":"STANAG 4626, ASAAC Phase II: Final draft of proposed standards for software. 2004."}],"container-title":["Reliability Engineering & System Safety"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0951832014002257?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0951832014002257?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,8,14]],"date-time":"2019-08-14T21:34:58Z","timestamp":1565818498000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0951832014002257"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,1]]},"references-count":37,"alternative-id":["S0951832014002257"],"URL":"https:\/\/doi.org\/10.1016\/j.ress.2014.09.015","relation":{},"ISSN":["0951-8320"],"issn-type":[{"value":"0951-8320","type":"print"}],"subject":[],"published":{"date-parts":[[2015,1]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"An analytical model of electronic fault diagnosis on extension of the dependency theory","name":"articletitle","label":"Article Title"},{"value":"Reliability Engineering & System Safety","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.ress.2014.09.015","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"article","name":"content_type","label":"Content Type"},{"value":"Copyright \u00a9 2014 Elsevier Ltd. All rights reserved.","name":"copyright","label":"Copyright"}]}}