乐胖代购免代理版

{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,14]],"date-time":"2023-09-14T13:58:22Z","timestamp":1694699902096},"reference-count":47,"publisher":"Elsevier BV","issue":"9-11","license":[{"start":{"date-parts":[[2005,9,1]],"date-time":"2005-09-01T00:00:00Z","timestamp":1125532800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microelectronics Reliability"],"published-print":{"date-parts":[[2005,9]]},"DOI":"10.1016\/j.microrel.2005.07.064","type":"journal-article","created":{"date-parts":[[2005,9,25]],"date-time":"2005-09-25T07:13:42Z","timestamp":1127632422000},"page":"1585-1592","source":"Crossref","is-referenced-by-count":7,"title":["DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure FETs: performance and reliability issues"],"prefix":"10.1016","volume":"45","author":[{"given":"G.","family":"Verzellesi","sequence":"first","affiliation":[]},{"given":"G.","family":"Meneghesso","sequence":"additional","affiliation":[]},{"given":"A.","family":"Chini","sequence":"additional","affiliation":[]},{"given":"E.","family":"Zanoni","sequence":"additional","affiliation":[]},{"given":"C.","family":"Canali","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/j.microrel.2005.07.064_bib1","doi-asserted-by":"crossref","first-page":"119","DOI":"10.1016\/0378-4363(85)90559-5","volume":"129","author":"Rocchi","year":"1985","journal-title":"Physica B"},{"key":"10.1016\/j.microrel.2005.07.064_bib2","doi-asserted-by":"crossref","first-page":"139","DOI":"10.1049\/el:19870098","volume":"23","author":"Dumas","year":"1987","journal-title":"Electron Lett"},{"key":"10.1016\/j.microrel.2005.07.064_bib3","first-page":"842","author":"Yeats","year":"1988","journal-title":"IEDM Tech Dig"},{"issue":"8","key":"10.1016\/j.microrel.2005.07.064_bib4","doi-asserted-by":"crossref","first-page":"1733","DOI":"10.1109\/TED.2003.815134","volume":"50","author":"Verzellesi","year":"2003","journal-title":"IEEE Trans Electron Dev"},{"issue":"10","key":"10.1016\/j.microrel.2005.07.064_bib5","doi-asserted-by":"crossref","first-page":"1554","DOI":"10.1109\/TED.2004.835025","volume":"51","author":"Meneghesso","year":"2004","journal-title":"IEEE Trans Electron Dev"},{"issue":"6","key":"10.1016\/j.microrel.2005.07.064_bib6","doi-asserted-by":"crossref","first-page":"1048","DOI":"10.1109\/JPROC.2002.1021569","volume":"90","author":"Binari","year":"2002","journal-title":"Proc IEEE"},{"issue":"1","key":"10.1016\/j.microrel.2005.07.064_bib7","doi-asserted-by":"crossref","first-page":"157","DOI":"10.1143\/JJAP.14.157","volume":"12","author":"Wada","year":"1975","journal-title":"Jpn J Appl Phys"},{"issue":"3","key":"10.1016\/j.microrel.2005.07.064_bib8","doi-asserted-by":"crossref","first-page":"257","DOI":"10.1109\/16.2449","volume":"35","author":"Ladbrooke","year":"1988","journal-title":"IEEE Trans Electron Dev"},{"issue":"5","key":"10.1016\/j.microrel.2005.07.064_bib9","doi-asserted-by":"crossref","first-page":"687","DOI":"10.1109\/16.568027","volume":"44","author":"Kruppa","year":"1997","journal-title":"IEEE Trans Electron Dev"},{"key":"10.1016\/j.microrel.2005.07.064_bib10","first-page":"211","author":"Mickanin","year":"1989","journal-title":"Proc GaAs IC Symp"},{"key":"10.1016\/j.microrel.2005.07.064_bib11","first-page":"389","author":"Saysset","year":"1995","journal-title":"Proc of ESREF\u201995"},{"issue":"7","key":"10.1016\/j.microrel.2005.07.064_bib12","doi-asserted-by":"crossref","first-page":"383","DOI":"10.1109\/LED.2002.1015205","volume":"23","author":"Mazzanti","year":"2002","journal-title":"IEEE Electron Dev Lett"},{"issue":"3","key":"10.1016\/j.microrel.2005.07.064_bib13","doi-asserted-by":"crossref","first-page":"465","DOI":"10.1109\/16.906437","volume":"48","author":"Binary","year":"2001","journal-title":"IEEE Trans Electron Dev"},{"issue":"10","key":"10.1016\/j.microrel.2005.07.064_bib14","doi-asserted-by":"crossref","first-page":"1447","DOI":"10.1109\/T-ED.1986.22693","volume":"33","author":"Blight","year":"1986","journal-title":"IEEE Trans Electron Dev"},{"issue":"5","key":"10.1016\/j.microrel.2005.07.064_bib15","doi-asserted-by":"crossref","first-page":"752","DOI":"10.1109\/22.234507","volume":"41","author":"Huang","year":"1993","journal-title":"IEEE Trans Microwave Theory Tech"},{"issue":"7","key":"10.1016\/j.microrel.2005.07.064_bib16","doi-asserted-by":"crossref","first-page":"1060","DOI":"10.1109\/16.595932","volume":"44","author":"Balakrishnan","year":"1997","journal-title":"IEEE Trans Electron Dev"},{"issue":"2","key":"10.1016\/j.microrel.2005.07.064_bib17","doi-asserted-by":"crossref","first-page":"190","DOI":"10.1109\/16.902715","volume":"48","author":"Choi","year":"2001","journal-title":"IEEE Trans Electron Dev"},{"issue":"3","key":"10.1016\/j.microrel.2005.07.064_bib18","doi-asserted-by":"crossref","first-page":"560","DOI":"10.1109\/16.906451","volume":"48","author":"Vetury","year":"2001","journal-title":"IEEE Trans Electron Dev"},{"issue":"2","key":"10.1016\/j.microrel.2005.07.064_bib19","doi-asserted-by":"crossref","first-page":"634","DOI":"10.1109\/TMTT.2002.807687","volume":"51","author":"Kohn","year":"2003","journal-title":"IEEE Trans Microwave Theory Tech"},{"issue":"2","key":"10.1016\/j.microrel.2005.07.064_bib20","doi-asserted-by":"crossref","first-page":"618","DOI":"10.1109\/TMTT.2002.807680","volume":"51","author":"Green","year":"2003","journal-title":"IEEE Trans Microwave Theory Tech"},{"key":"10.1016\/j.microrel.2005.07.064_bib21","doi-asserted-by":"crossref","first-page":"1931","DOI":"10.1063\/1.338040","volume":"61","author":"Harrang","year":"1987","journal-title":"J Appl Phys"},{"issue":"9","key":"10.1016\/j.microrel.2005.07.064_bib22","doi-asserted-by":"crossref","first-page":"1504","DOI":"10.1109\/16.310100","volume":"41","author":"Lo","year":"1994","journal-title":"IEEE Trans Electron Dev"},{"issue":"4","key":"10.1016\/j.microrel.2005.07.064_bib23","doi-asserted-by":"crossref","first-page":"648","DOI":"10.1109\/16.753696","volume":"46","author":"Horio","year":"1999","journal-title":"IEEE Trans Electron Dev"},{"issue":"8","key":"10.1016\/j.microrel.2005.07.064_bib24","doi-asserted-by":"crossref","first-page":"5297","DOI":"10.1063\/1.1611629","volume":"94","author":"Cavallini","year":"2003","journal-title":"J Appl Phys"},{"issue":"8","key":"10.1016\/j.microrel.2005.07.064_bib25","doi-asserted-by":"crossref","first-page":"517","DOI":"10.1109\/LED.2004.831965","volume":"25","author":"Verzellesi","year":"2004","journal-title":"IEEE Electron Dev Lett"},{"issue":"4","key":"10.1016\/j.microrel.2005.07.064_bib26","doi-asserted-by":"crossref","first-page":"594","DOI":"10.1109\/TED.2005.845149","volume":"52","author":"Verzellesi","year":"2005","journal-title":"IEEE Trans Electron Dev"},{"issue":"10","key":"10.1016\/j.microrel.2005.07.064_bib27","doi-asserted-by":"crossref","first-page":"1411","DOI":"10.1063\/1.117598","volume":"69","author":"Meneghesso","year":"1996","journal-title":"Appl Phys Lett"},{"issue":"5","key":"10.1016\/j.microrel.2005.07.064_bib28","doi-asserted-by":"crossref","first-page":"232","DOI":"10.1109\/55.491839","volume":"17","author":"Meneghesso","year":"1996","journal-title":"IEEE Electron Device Lett"},{"issue":"7","key":"10.1016\/j.microrel.2005.07.064_bib29","doi-asserted-by":"crossref","first-page":"1121","DOI":"10.1016\/S0026-2714(96)00273-9","volume":"37","author":"Meneghesso","year":"1997","journal-title":"Micro Reliab"},{"issue":"2","key":"10.1016\/j.microrel.2005.07.064_bib30","doi-asserted-by":"crossref","first-page":"261","DOI":"10.1109\/16.822265","volume":"47","author":"Dieci","year":"2000","journal-title":"IEEE Trans Electron Dev"},{"issue":"3","key":"10.1016\/j.microrel.2005.07.064_bib31","doi-asserted-by":"crossref","first-page":"498","DOI":"10.1109\/16.824715","volume":"47","author":"Leoni","year":"2000","journal-title":"IEEE Trans Electron Dev"},{"issue":"9","key":"10.1016\/j.microrel.2005.07.064_bib32","doi-asserted-by":"crossref","first-page":"1929","DOI":"10.1109\/16.944179","volume":"48","author":"Dieci","year":"2001","journal-title":"IEEE Trans Electron Dev"},{"issue":"3","key":"10.1016\/j.microrel.2005.07.064_bib33","doi-asserted-by":"crossref","first-page":"65","DOI":"10.1109\/TDMR.2002.804512","volume":"2","author":"Mazzanti","year":"2002","journal-title":"IEEE Trans Dev Mater Reliab"},{"issue":"7","key":"10.1016\/j.microrel.2005.07.064_bib34","doi-asserted-by":"crossref","first-page":"421","DOI":"10.1109\/LED.2003.813375","volume":"24","author":"Kim","year":"2003","journal-title":"IEEE Electron Dev Lett"},{"issue":"4","key":"10.1016\/j.microrel.2005.07.064_bib35","doi-asserted-by":"crossref","first-page":"886","DOI":"10.1109\/TED.2003.812489","volume":"50","author":"Koley","year":"2003","journal-title":"IEEE Trans Electron Dev"},{"issue":"10","key":"10.1016\/j.microrel.2005.07.064_bib36","doi-asserted-by":"crossref","first-page":"2015","DOI":"10.1109\/TED.2003.816549","volume":"50","author":"Mizutani","year":"2003","journal-title":"IEEE Trans Electron Dev"},{"issue":"6","key":"10.1016\/j.microrel.2005.07.064_bib37","doi-asserted-by":"crossref","first-page":"268","DOI":"10.1109\/55.843146","volume":"21","author":"Green","year":"2000","journal-title":"IEEE Electron Dev Lett"},{"key":"10.1016\/j.microrel.2005.07.064_bib38","doi-asserted-by":"crossref","first-page":"1013","DOI":"10.1109\/T-ED.1980.19979","volume":"27","author":"Wemple","year":"1980","journal-title":"IEEE Trans Electron Dev"},{"key":"10.1016\/j.microrel.2005.07.064_bib39","first-page":"585","author":"Kikkawa","year":"2001","journal-title":"IEDM Technical Digest"},{"key":"10.1016\/j.microrel.2005.07.064_bib40","first-page":"415","author":"Meneghesso","year":"2005","journal-title":"Proc IRPS\u201905"},{"issue":"1","key":"10.1016\/j.microrel.2005.07.064_bib41","doi-asserted-by":"crossref","DOI":"10.1109\/LED.2003.821673","volume":"25","author":"Shen","year":"2004","journal-title":"IEEE Electron Dev Lett"},{"issue":"9","key":"10.1016\/j.microrel.2005.07.064_bib42","doi-asserted-by":"crossref","first-page":"1983","DOI":"10.1109\/TED.2003.815577","volume":"50","author":"Wakejima","year":"2003","journal-title":"IEEE Trans Electron Dev"},{"issue":"5","key":"10.1016\/j.microrel.2005.07.064_bib43","doi-asserted-by":"crossref","first-page":"289","DOI":"10.1109\/LED.2003.812532","volume":"24","author":"Ando","year":"2003","journal-title":"IEEE Electron Dev Lett"},{"issue":"1","key":"10.1016\/j.microrel.2005.07.064_bib44","doi-asserted-by":"crossref","DOI":"10.1049\/el:20040017","volume":"40","author":"Chini","year":"2004","journal-title":"Electr Lett"},{"issue":"3","key":"10.1016\/j.microrel.2005.07.064_bib45","doi-asserted-by":"crossref","first-page":"117","DOI":"10.1109\/LED.2003.822667","volume":"25","author":"Wu","year":"2004","journal-title":"IEEE Electron Dev Lett"},{"issue":"12","key":"10.1016\/j.microrel.2005.07.064_bib46","doi-asserted-by":"crossref","first-page":"2217","DOI":"10.1109\/TED.2004.838453","volume":"51","author":"Okamoto","year":"2004","journal-title":"IEEE Trans Electron Dev"},{"key":"10.1016\/j.microrel.2005.07.064_bib47","doi-asserted-by":"crossref","first-page":"1078","DOI":"10.1109\/IEDM.2004.1419386","author":"Wu","year":"2004","journal-title":"IEDM Tech Dig"}],"container-title":["Microelectronics Reliability"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271405002155?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0026271405002155?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2019,1,21]],"date-time":"2019-01-21T22:55:09Z","timestamp":1548111309000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0026271405002155"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2005,9]]},"references-count":47,"journal-issue":{"issue":"9-11","published-print":{"date-parts":[[2005,9]]}},"alternative-id":["S0026271405002155"],"URL":"https:\/\/doi.org\/10.1016\/j.microrel.2005.07.064","relation":{},"ISSN":["0026-2714"],"issn-type":[{"value":"0026-2714","type":"print"}],"subject":[],"published":{"date-parts":[[2005,9]]}}}