{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,4,7]],"date-time":"2024-04-07T08:31:56Z","timestamp":1712478716230},"reference-count":33,"publisher":"Elsevier BV","issue":"12","license":[{"start":{"date-parts":[[2008,11,1]],"date-time":"2008-11-01T00:00:00Z","timestamp":1225497600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Information and Software Technology"],"published-print":{"date-parts":[[2008,11]]},"DOI":"10.1016\/j.infsof.2007.12.001","type":"journal-article","created":{"date-parts":[[2008,1,11]],"date-time":"2008-01-11T13:05:27Z","timestamp":1200056727000},"page":"1232-1247","source":"Crossref","is-referenced-by-count":22,"title":["Does software reliability growth behavior follow a non-homogeneous Poisson process"],"prefix":"10.1016","volume":"50","author":[{"given":"Kai-Yuan","family":"Cai","sequence":"first","affiliation":[]},{"given":"De-Bin","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Cheng-Gang","family":"Bai","sequence":"additional","affiliation":[]},{"given":"Hai","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Tao","family":"Jing","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/j.infsof.2007.12.001_bib1","unstructured":"G.R. Hudson, Program errors as a birth and death process, System Development Corporation, Report SP-3011, Santa Monica, CA, 1967."},{"key":"10.1016\/j.infsof.2007.12.001_bib2","series-title":"Software Reliability: Measurement, Prediction, Application","author":"Musa","year":"1987"},{"key":"10.1016\/j.infsof.2007.12.001_bib3","series-title":"Software Reliability Modeling","author":"Xie","year":"1991"},{"key":"10.1016\/j.infsof.2007.12.001_bib4","series-title":"Handbook of Software Reliability Engineering","year":"1996"},{"key":"10.1016\/j.infsof.2007.12.001_bib5","series-title":"Software Defect and Operational Profile Modeling","author":"Cai","year":"1998"},{"key":"10.1016\/j.infsof.2007.12.001_bib6","series-title":"Software Reliability","author":"Pham","year":"2000"},{"key":"10.1016\/j.infsof.2007.12.001_bib7","series-title":"Statistical Computer Performance Evaluation","first-page":"465","article-title":"Software reliability research","author":"Jelinski","year":"1972"},{"key":"10.1016\/j.infsof.2007.12.001_bib8","unstructured":"E.C. Nelson, A Statistical Basis for Software Reliability Assessment, TRW-SS-73-03, 1973."},{"key":"10.1016\/j.infsof.2007.12.001_bib9","doi-asserted-by":"crossref","unstructured":"M.L. Shooman, Probabilistic models for software reliability prediction, in: Proc. the Fault-Tolerant Computing Symposium, 1972, pp. 211\u2013215.","DOI":"10.1016\/B978-0-12-266950-7.50029-3"},{"issue":"3","key":"10.1016\/j.infsof.2007.12.001_bib10","doi-asserted-by":"crossref","first-page":"332","DOI":"10.2307\/2346781","article-title":"A Bayesian reliability growth model for computer software","volume":"22","author":"Littlewood","year":"1973","journal-title":"Applied Statistics"},{"key":"10.1016\/j.infsof.2007.12.001_bib11","series-title":"Elements of Software Science","author":"Halstead","year":"1977"},{"issue":"3","key":"10.1016\/j.infsof.2007.12.001_bib12","doi-asserted-by":"crossref","first-page":"312","DOI":"10.1109\/TSE.1975.6312856","article-title":"A theory of software reliability and its application","volume":"SE-1","author":"Musa","year":"1975","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"6","key":"10.1016\/j.infsof.2007.12.001_bib13","doi-asserted-by":"crossref","first-page":"337","DOI":"10.1145\/390016.808456","article-title":"Analysis of error processes in computer software","volume":"10","author":"Schneidewind","year":"1975","journal-title":"Sigplan Notes"},{"key":"10.1016\/j.infsof.2007.12.001_bib14","unstructured":"M. Xie, M. Zhao, The Schneidewind software reliability model revisited, in: Proc. IEEE International Symposium on Software Reliability Engineering, 1992, pp. 184\u2013192."},{"key":"10.1016\/j.infsof.2007.12.001_bib15","unstructured":"T. Nara, M. Nakata, A. Ooishi, Software reliability growth analysis \u2013 application of NHPP models and its evaluation, in: Proc. IEEE International Symposium on Software Reliability Engineering, 1995, pp. 251\u2013255."},{"key":"10.1016\/j.infsof.2007.12.001_bib16","doi-asserted-by":"crossref","first-page":"69","DOI":"10.1109\/2.544240","article-title":"Predicting software reliability","author":"Wood","year":"1996","journal-title":"Computer"},{"key":"10.1016\/j.infsof.2007.12.001_bib17","doi-asserted-by":"crossref","unstructured":"T. Keller, N.F. Schneidwind, Successful application of software reliability engineering for the NASA Space Shuttle, in: Proc. IEEE International Symposium on Software Reliability Engineering (Case Studies), 1997, pp. 71\u201382.","DOI":"10.1109\/ISSRE.1997.630854"},{"key":"10.1016\/j.infsof.2007.12.001_bib18","unstructured":"K.C. Gross, Software reliability and system availability at Sun, in: Proc. 11th International Symposium on Software Reliability Engineering, 2000."},{"key":"10.1016\/j.infsof.2007.12.001_bib19","doi-asserted-by":"crossref","first-page":"475","DOI":"10.1016\/S0377-2217(02)00498-8","article-title":"Software reliability and cost models: perspectives, comparison, and practice","volume":"149","author":"Pham","year":"2003","journal-title":"European Journal of Operational Research"},{"key":"10.1016\/j.infsof.2007.12.001_bib20","doi-asserted-by":"crossref","unstructured":"H. Okamura, M. Grottke, T. Dohi, K.S. Trivedi, Variational Bayesian approach for interval estimation of NHPP-based software reliability models, in: Proc. 37th Annual IEEE\/IFIP International Conference on Dependable Systems and Networks, 2007, pp. 698\u2013707.","DOI":"10.1109\/DSN.2007.101"},{"key":"10.1016\/j.infsof.2007.12.001_bib21","unstructured":"A.L. Goel, K. Okumoto, A time dependent error detection rate for a large scale software system, in: Proc. the 3rd USA\u2013Japan Computer Conference, 1978, pp. 35\u201340."},{"key":"10.1016\/j.infsof.2007.12.001_bib22","doi-asserted-by":"crossref","first-page":"137","DOI":"10.1016\/S0020-0255(00)00018-9","article-title":"Towards a conceptual framework of software run reliability modeling","volume":"126","author":"Cai","year":"2000","journal-title":"Information Sciences"},{"key":"10.1016\/j.infsof.2007.12.001_bib23","unstructured":"F.I. Vokolos, P.G. Frankl, Empirical evaluation of the textual differencing regression testing technique, in: Proc. the International Conference on Software Maintenance, November 1998, pp. 44\u201353."},{"issue":"10","key":"10.1016\/j.infsof.2007.12.001_bib24","doi-asserted-by":"crossref","first-page":"929","DOI":"10.1109\/32.962562","article-title":"Prioritizing test cases for regression testing","volume":"27","author":"Rothermel","year":"2001","journal-title":"IEEE Transactions on Software Engineering"},{"key":"10.1016\/j.infsof.2007.12.001_bib25","doi-asserted-by":"crossref","first-page":"1328","DOI":"10.1016\/j.jss.2006.11.008","article-title":"Adaptive software testing with fixed-memory feedback","volume":"80","author":"Cai","year":"2007","journal-title":"Journal of Systems and Software"},{"issue":"1","key":"10.1016\/j.infsof.2007.12.001_bib26","doi-asserted-by":"crossref","first-page":"17","DOI":"10.1002\/bimj.4710210104","article-title":"On the Kolmogorov\u2013Smirnov test for the Poisson distribution with unknown mean","volume":"21","author":"Campbell","year":"1979","journal-title":"Biometrics Journal"},{"issue":"1","key":"10.1016\/j.infsof.2007.12.001_bib27","doi-asserted-by":"crossref","first-page":"81","DOI":"10.2307\/3315691","article-title":"Empirical-distribution-function goodness-of-fit tests for discrete models","volume":"24","author":"Henze","year":"1996","journal-title":"The Canadian Journal of Statistics"},{"issue":"2","key":"10.1016\/j.infsof.2007.12.001_bib28","doi-asserted-by":"crossref","first-page":"257","DOI":"10.2307\/3315735","article-title":"Cramer\u2013von Mises tests of fit for the poisson distribution","volume":"25","author":"Spinelli","year":"1997","journal-title":"The Canadian Journal of Statistics"},{"key":"10.1016\/j.infsof.2007.12.001_bib29","doi-asserted-by":"crossref","unstructured":"A.L. Goel, Software Reliability Modeling and Estimation Techniques, RADC-TR-82-263, 1982.","DOI":"10.21236\/ADA123421"},{"key":"10.1016\/j.infsof.2007.12.001_bib30","series-title":"Statistical and Probabilistic Models in Reliability","first-page":"27","article-title":"CPIT goodness-of-fit tests for reliability growth models","author":"Gaudoin","year":"1999"},{"key":"10.1016\/j.infsof.2007.12.001_bib31","doi-asserted-by":"crossref","first-page":"337","DOI":"10.2307\/1428006","article-title":"Unification of software reliability models by self-exciting point processes","volume":"29","author":"Chen","year":"1997","journal-title":"Advances in Applied Probability"},{"key":"10.1016\/j.infsof.2007.12.001_bib32","doi-asserted-by":"crossref","first-page":"357","DOI":"10.1016\/0951-8320(91)90009-V","article-title":"A critical review on software reliability modeling","volume":"32","author":"Cai","year":"1991","journal-title":"Reliability Engineering and System Safety"},{"key":"10.1016\/j.infsof.2007.12.001_bib33","doi-asserted-by":"crossref","first-page":"173","DOI":"10.1016\/S0164-1212(02)00013-4","article-title":"Analyzing software science data with partial repeatability","volume":"63","author":"Cai","year":"2002","journal-title":"Journal of Systems and Software"}],"container-title":["Information and Software Technology"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0950584908000104?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0950584908000104?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2020,4,30]],"date-time":"2020-04-30T17:25:06Z","timestamp":1588267506000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0950584908000104"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,11]]},"references-count":33,"journal-issue":{"issue":"12","published-print":{"date-parts":[[2008,11]]}},"alternative-id":["S0950584908000104"],"URL":"https:\/\/doi.org\/10.1016\/j.infsof.2007.12.001","relation":{},"ISSN":["0950-5849"],"issn-type":[{"value":"0950-5849","type":"print"}],"subject":[],"published":{"date-parts":[[2008,11]]}}}