{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,17]],"date-time":"2024-07-17T18:37:52Z","timestamp":1721241472892},"reference-count":9,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2013,3,20]],"date-time":"2013-03-20T00:00:00Z","timestamp":1363737600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1007\/s10836-013-5364-1","type":"journal-article","created":{"date-parts":[[2013,3,19]],"date-time":"2013-03-19T07:14:52Z","timestamp":1363677292000},"page":"249-253","source":"Crossref","is-referenced-by-count":15,"title":["A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients"],"prefix":"10.1007","volume":"29","author":[{"given":"Zhichao","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Yi","family":"Ren","sequence":"additional","affiliation":[]},{"given":"Li","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Nelson J.","family":"Gaspard","sequence":"additional","affiliation":[]},{"given":"Arthur. F.","family":"Witulski","sequence":"additional","affiliation":[]},{"given":"Timothy W.","family":"Holman","sequence":"additional","affiliation":[]},{"given":"Bharat L.","family":"Bhuva","sequence":"additional","affiliation":[]},{"given":"Shi-Jie","family":"Wen","sequence":"additional","affiliation":[]},{"given":"Ramaswami","family":"Sammynaiken","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2013,3,20]]},"reference":[{"issue":"6","key":"5364_CR1","doi-asserted-by":"crossref","first-page":"2407","DOI":"10.1109\/TNS.2007.910863","volume":"54","author":"S Dasgupta","year":"2007","unstructured":"Dasgupta S, Witulski AF, Bhuva BL, Alles ML (2007) Effect of Well and Substrate Potential Modulation on Single Event Pulse Shape in Deep Submicron CMOS. IEEE Trans Nucl Sci 54(6):2407\u20132412","journal-title":"IEEE Trans Nucl Sci"},{"key":"5364_CR2","doi-asserted-by":"crossref","unstructured":"Leite F, Balen T, Herve M, Lubaszewski M, Wirth G (2009) \u201cUsing bulk built-in current sensors and recomputing techniques to mitigate transient faults in microprocessors,\u201d 10th Latin American Test Workshop, pp. 1\u20136","DOI":"10.1109\/LATW.2009.4813790"},{"key":"5364_CR3","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1109\/MM.2006.103","volume":"26","author":"EH Neto","year":"2006","unstructured":"Neto EH, Ribeiro I, Vieira M, Wirth G (2006) Using bulk built-in current sensors to detect soft errors. Micro IEEE 26:10\u201318","journal-title":"Micro IEEE"},{"key":"5364_CR4","doi-asserted-by":"crossref","unstructured":"Shivakumar P, Kistler M, Keckler SW, Burger D, Alvisi L (2002) \u201cModeling the effect of technology trends on the soft error rate of combinational logic,\u201d Dependable Systems and Networks, 2002. Proceedings. International Conference on, pp. 389\u2013398","DOI":"10.1109\/DSN.2002.1028924"},{"key":"5364_CR5","unstructured":"Shivakumar P et al. (2002 August) Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic. Int\u2019l Conf. Dependable Systems and Networks (DSN 02), IEEE CS Press, p. 389\u2013398"},{"key":"5364_CR6","doi-asserted-by":"crossref","unstructured":"Vargas F, Nicolaidis M (1994) \u201cSEU-tolerant SRAM design based on current monitoring,\u201d 24th Fault-Tolerant Computing Symposium on, pp. 106\u2013115","DOI":"10.1109\/FTCS.1994.315652"},{"key":"5364_CR7","doi-asserted-by":"crossref","unstructured":"Vargas F, Nicolaidis M (1994) SEU-tolerant SRAM Design Based on Current Monitoring. Fault-Tolerant Computing, FTCS-24, p. 106\u2013115","DOI":"10.1109\/FTCS.1994.315652"},{"key":"5364_CR8","doi-asserted-by":"crossref","unstructured":"Wirth G, Fayomi C (2007) \u201cThe bulk built-in current sensor approach for single event transient detection,\u201d International Symposium on System-on-Chip, pp. 1\u20134","DOI":"10.1109\/ISSOC.2007.4427422"},{"key":"5364_CR9","doi-asserted-by":"crossref","unstructured":"Wirth G, Fayomi C (2007 Nov 20\u201321) The Bulk Built-In Current Sensor Approach for Single Event Transient Detection. Int Symp Syst-on-Chip : 1\u20134","DOI":"10.1109\/ISSOC.2007.4427422"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-013-5364-1.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-013-5364-1\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-013-5364-1","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,11]],"date-time":"2019-07-11T03:29:16Z","timestamp":1562815756000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-013-5364-1"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,3,20]]},"references-count":9,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2013,4]]}},"alternative-id":["5364"],"URL":"https:\/\/doi.org\/10.1007\/s10836-013-5364-1","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,3,20]]}}}