{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T09:06:31Z","timestamp":1725613591954},"publisher-location":"Berlin, Heidelberg","reference-count":13,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642241536"},{"type":"electronic","value":"9783642241543"}],"license":[{"start":{"date-parts":[[2011,1,1]],"date-time":"2011-01-01T00:00:00Z","timestamp":1293840000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2011,1,1]],"date-time":"2011-01-01T00:00:00Z","timestamp":1293840000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011]]},"DOI":"10.1007\/978-3-642-24154-3_16","type":"book-chapter","created":{"date-parts":[[2011,9,24]],"date-time":"2011-09-24T03:38:58Z","timestamp":1316835538000},"page":"152-161","source":"Crossref","is-referenced-by-count":0,"title":["NBTI Mitigation by Giving Random Scan-in Vectors during Standby Mode"],"prefix":"10.1007","author":[{"given":"Toshihiro","family":"Kameda","sequence":"first","affiliation":[]},{"given":"Hiroaki","family":"Konoura","sequence":"additional","affiliation":[]},{"given":"Yukio","family":"Mitsuyama","sequence":"additional","affiliation":[]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[]},{"given":"Takao","family":"Onoye","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"16_CR1","doi-asserted-by":"publisher","first-page":"509","DOI":"10.1109\/TDMR.2007.910130","volume":"7","author":"W. Wang","year":"2007","unstructured":"Wang, W., Reddy, V., Krishnan, A.T., Vattikonda, R., Krishnan, S., Cao, Y.: Compact modeling and simulation of circuit reliability for 65nm CMOS technology. IEEE Transactions on Device and Material Reliability\u00a07, 509\u2013517 (2007)","journal-title":"IEEE Transactions on Device and Material Reliability"},{"key":"16_CR2","doi-asserted-by":"crossref","unstructured":"Ramey, S., Prasad, C., Agostinelli, M., Pae, S., Walstra, S., Gupta, S., Hicks, J.: Frequency and Recovery Effects in High- k BTI Degradation. In: International Reliability Physics Symposium, pp. 1023\u20131027 (2009)","DOI":"10.1109\/IRPS.2009.5173404"},{"issue":"2","key":"16_CR3","doi-asserted-by":"publisher","first-page":"140","DOI":"10.1109\/TVLSI.2003.821546","volume":"12","author":"A. Abdollahi","year":"2004","unstructured":"Abdollahi, A., Fallah, F., Pedram, M.: Leakage current reduction in CMOS VLSI circuits by input vector control. IEEE Transactions on Very Large Scale Integration Systems\u00a012(2), 140\u2013154 (2004)","journal-title":"IEEE Transactions on Very Large Scale Integration Systems"},{"key":"16_CR4","doi-asserted-by":"crossref","unstructured":"Wang, Y., Luo, H., He, K., Luo, R., Yang, H., Xie, Y.: Temperature-aware NBTI modeling and the impact of input vector control on performance degradation. In: Design, Automation, and Test in Europe conference, pp. 546\u2013551 (2007)","DOI":"10.1109\/DATE.2007.364650"},{"key":"16_CR5","doi-asserted-by":"crossref","unstructured":"Wang, Y., Chen, X., Wang, W., Balakrishnan, V., Cao, Y., Xie, Y., Yang, H.: On the efficacy of input vector control to mitigate NBTI effects and leakage power. In: International Symposium on Quality Electronic Design, pp. 19\u201326 (2009)","DOI":"10.1109\/ISQED.2009.4810264"},{"key":"16_CR6","doi-asserted-by":"crossref","unstructured":"Bild, D.R., Bok, G., Dick, R.P.: Minimization of NBTI performance degradation using internal node control. In: Design, Automation, and Test in Europe Conference, pp. 148\u2013153 (2009)","DOI":"10.1109\/DATE.2009.5090649"},{"key":"16_CR7","doi-asserted-by":"crossref","unstructured":"Jin, S., Zhang, L., Li, H., Li, X., Yan, G.: M-IVC: Using Multiple Input Vectors to Minimize Aging-induced Delay. In: Asian Test Symposium, pp. 437\u2013442 (2009)","DOI":"10.1109\/ATS.2009.57"},{"key":"16_CR8","doi-asserted-by":"crossref","unstructured":"Calimera, A., Macii, E., Poncino, M.: NBTI-aware sleep transistor design for reliable power-gating. In: Great Lakes Symposium on VLSI, pp. 333\u2013338 (2009)","DOI":"10.1145\/1531542.1531618"},{"key":"16_CR9","doi-asserted-by":"crossref","unstructured":"Konoura, H., Mitsuyama, Y., Hashimoto, M., Onoye, T.: Comparative study on delay degrading estimation due to NBTI with circuit\/instance\/transistor-level stress probability consideration. In: International Symposium on Quality Electronic Design, pp. 646\u2013651 (2010)","DOI":"10.1109\/ISQED.2010.5450508"},{"key":"16_CR10","unstructured":"Cao, Y.: Reliability mechanisms and the impact on IC designs. In: Asia and South Pacific Design Automation Conference, Tutorial, vol.\u00a04, pp. 342\u2013372 (2009)"},{"key":"16_CR11","doi-asserted-by":"publisher","first-page":"71","DOI":"10.1016\/j.microrel.2004.03.019","volume":"45","author":"M.A. Alam","year":"2005","unstructured":"Alam, M.A., Mahapatra, S.: A comprehensive model of PMOS NBTI degradation. Microelectronics Reliability\u00a045, 71\u201381 (2005)","journal-title":"Microelectronics Reliability"},{"key":"16_CR12","doi-asserted-by":"crossref","unstructured":"Lee, J.H., Wu, W.H., Islam, A.E., Alam, M.A., Oates, A.S.: Separation method of hole trapping and interface trap generation and their roles in NBTI reaction-diffusion model. In: International Reliability Physics Symposium, pp. 745\u2013746 (2008)","DOI":"10.1109\/RELPHY.2008.4559018"},{"key":"16_CR13","unstructured":"Krishnan, A.T., Chansellor, C., Chakravarthi, S., Nicollian, P.E., Reddy, V., Varghese, A., Khamankar, R.B., Krishnan, S.: Material dependence of hydrogen diffusion: implications for NBTI degradation. In: IEEE International Electron Devices Meeting, pp. 688\u2013691 (2005)"}],"container-title":["Lecture Notes in Computer Science","Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-24154-3_16","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,20]],"date-time":"2019-05-20T00:08:51Z","timestamp":1558310931000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-24154-3_16"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011]]},"ISBN":["9783642241536","9783642241543"],"references-count":13,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-24154-3_16","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2011]]}}}