{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,9]],"date-time":"2024-09-09T16:40:43Z","timestamp":1725900043510},"publisher-location":"Berlin, Heidelberg","reference-count":17,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783642118395"},{"type":"electronic","value":"9783642118401"}],"license":[{"start":{"date-parts":[[2010,1,1]],"date-time":"2010-01-01T00:00:00Z","timestamp":1262304000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010]]},"DOI":"10.1007\/978-3-642-11840-1_20","type":"book-chapter","created":{"date-parts":[[2010,8,16]],"date-time":"2010-08-16T10:21:30Z","timestamp":1281954090000},"page":"269-282","source":"Crossref","is-referenced-by-count":1,"title":["Optical Inspection of Welding Seams"],"prefix":"10.1007","author":[{"given":"Fabian","family":"Timm","sequence":"first","affiliation":[]},{"given":"Thomas","family":"Martinetz","sequence":"additional","affiliation":[]},{"given":"Erhardt","family":"Barth","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"20_CR1","doi-asserted-by":"publisher","first-page":"455","DOI":"10.1007\/s00170-007-1117-6","volume":"38","author":"T. Ong","year":"2008","unstructured":"Ong, T., Samad, Z., Ratnam, M.: Solder joint inspection with multi-angle imaging and an artificial neural network. The Int. Journal of Advanced Manufacturing Technology\u00a038, 455\u2013462 (2008)","journal-title":"The Int. Journal of Advanced Manufacturing Technology"},{"key":"20_CR2","doi-asserted-by":"publisher","first-page":"479","DOI":"10.1016\/0262-8856(95)94381-9","volume":"13","author":"J. Kim","year":"1995","unstructured":"Kim, J., Cho, H.: Neural network-based inspection of solder joints using a circular illumination. Image and Vision Computing\u00a013, 479\u2013490 (1995)","journal-title":"Image and Vision Computing"},{"key":"20_CR3","doi-asserted-by":"publisher","first-page":"95","DOI":"10.1007\/s00138-006-0051-1","volume":"18","author":"S. Chiu","year":"2007","unstructured":"Chiu, S., Perng, M.: Reflection-area-based feature descriptor for solder joint inspection. Machine Vision and Applications\u00a018, 95\u2013106 (2007)","journal-title":"Machine Vision and Applications"},{"key":"20_CR4","doi-asserted-by":"publisher","first-page":"93","DOI":"10.1109\/6104.846932","volume":"23","author":"K. Ko","year":"2000","unstructured":"Ko, K., Cho, H.: Solder joints inspection using a neural network and fuzzy rule-based classification method. IEEE Transactions on Electronics Packaging Manufacturing\u00a023, 93\u2013103 (2000)","journal-title":"IEEE Transactions on Electronics Packaging Manufacturing"},{"key":"20_CR5","first-page":"933","volume-title":"Proc. of the Int. Joint Conf. on Neural Networks","author":"W. Poechmueller","year":"1991","unstructured":"Poechmueller, W., Glesner, M., Listl, L., Mengel, P.: Automatic classification of solder joint images. In: Proc. of the Int. Joint Conf. on Neural Networks, vol.\u00a02, pp. 933\u2013940. IEEE Computer Society Press, Los Alamitos (1991)"},{"key":"20_CR6","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1007\/BF02601831","volume":"3","author":"M. Driels","year":"1988","unstructured":"Driels, M., Lee, C.: Feature selection for automatic visual inspection of solder joints. The Int. Journal of Advanced Manufacturing Technology\u00a03, 3\u201332 (1988)","journal-title":"The Int. Journal of Advanced Manufacturing Technology"},{"key":"20_CR7","first-page":"273","volume":"20","author":"C. Cortes","year":"1995","unstructured":"Cortes, C., Vapnik, V.: Support-vector networks. Machine Learning\u00a020, 273\u2013297 (1995)","journal-title":"Machine Learning"},{"key":"20_CR8","doi-asserted-by":"publisher","first-page":"144","DOI":"10.1145\/130385.130401","volume-title":"Proc. of the 5th Annual ACM Workshop on Computational Learning Theory","author":"B. Boser","year":"1992","unstructured":"Boser, B., Guyon, I., Vapnik, V.: A training algorithm for optimal margin classifiers. In: Haussler, D. (ed.) Proc. of the 5th Annual ACM Workshop on Computational Learning Theory, pp. 144\u2013152. ACM Press, New York (1992)"},{"key":"20_CR9","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-2440-0","volume-title":"The Nature of Statistical Learning Theory","author":"V. Vapnik","year":"1995","unstructured":"Vapnik, V.: The Nature of Statistical Learning Theory. Springer, New York (1995)"},{"key":"20_CR10","unstructured":"Timm, F., Klement, S., Martinetz, T., Barth, E.: Welding inspection using novel specularity features and a one-class svm. In: Proc. of the Int. Conference on Imaging Theory and Applications, vol.\u00a01, pp. 146\u2013153. INSTICC (2009)"},{"key":"20_CR11","doi-asserted-by":"publisher","first-page":"1443","DOI":"10.1162\/089976601750264965","volume":"13","author":"B. Sch\u00f6lkopf","year":"2001","unstructured":"Sch\u00f6lkopf, B., Platt, J.C., Shawe-Taylor, J., Smola, A.J., Williamson, R.C.: Estimating the support of a high-dimensional distribution. Neural Computation\u00a013, 1443\u20131471 (2001)","journal-title":"Neural Computation"},{"key":"20_CR12","doi-asserted-by":"publisher","first-page":"45","DOI":"10.1023\/B:MACH.0000008084.60811.49","volume":"54","author":"D.M.J. Tax","year":"2004","unstructured":"Tax, D.M.J., Duin, R.P.W.: Support vector data description. Machine Learning\u00a054, 45\u201366 (2004)","journal-title":"Machine Learning"},{"key":"20_CR13","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"21","DOI":"10.1007\/978-3-540-69321-5_3","volume-title":"Pattern Recognition","author":"K. Labusch","year":"2008","unstructured":"Labusch, K., Timm, F., Martinetz, T.: Simple incremental one-class support vector classification. In: Rigoll, G. (ed.) DAGM 2008. LNCS, vol.\u00a05096, pp. 21\u201330. Springer, Heidelberg (2008)"},{"key":"20_CR14","doi-asserted-by":"publisher","first-page":"537","DOI":"10.1016\/0031-3203(94)00116-4","volume":"28","author":"Y.Q. Chen","year":"1995","unstructured":"Chen, Y.Q., Nixon, M.S., Thomas, D.W.: Statistical geometrical features for texture classification. Pattern Recognition\u00a028, 537\u2013552 (1995)","journal-title":"Pattern Recognition"},{"key":"20_CR15","doi-asserted-by":"publisher","first-page":"790","DOI":"10.1109\/ICPR.1996.546931","volume-title":"Proc. of the 13th Int. Conf. on Pattern Recognition","author":"R. Walker","year":"1996","unstructured":"Walker, R., Jackway, P.T.: Statistical geometric features: Extensions for cytological texture analysis. In: Proc. of the 13th Int. Conf. on Pattern Recognition, pp. 790\u2013794. IEEE Computer Society Press, Los Alamitos (1996)"},{"key":"20_CR16","volume-title":"The Image Processing Handbook","author":"J.C. Russ","year":"2007","unstructured":"Russ, J.C.: The Image Processing Handbook. CRC Press, Boca Raton (2007)"},{"key":"20_CR17","volume-title":"Proc. of the 19th Int. Conf. on Pattern Recognition","author":"F. Timm","year":"2008","unstructured":"Timm, F., Klement, S., Martinetz, T.: Fast model selection for maxminover-based training of support vector machines. In: Proc. of the 19th Int. Conf. on Pattern Recognition, Florida, USA. IEEE Computer Society Press, Los Alamitos (2008)"}],"container-title":["Communications in Computer and Information Science","Computer Vision, Imaging and Computer Graphics. Theory and Applications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-642-11840-1_20","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,20]],"date-time":"2019-05-20T21:26:42Z","timestamp":1558387602000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-642-11840-1_20"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010]]},"ISBN":["9783642118395","9783642118401"],"references-count":17,"URL":"https:\/\/doi.org\/10.1007\/978-3-642-11840-1_20","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2010]]}}}