{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T15:13:30Z","timestamp":1725808410074},"publisher-location":"Cham","reference-count":21,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783319120119"},{"type":"electronic","value":"9783319120126"}],"license":[{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015]]},"DOI":"10.1007\/978-3-319-12012-6_73","type":"book-chapter","created":{"date-parts":[[2014,10,31]],"date-time":"2014-10-31T15:09:45Z","timestamp":1414768185000},"page":"659-666","source":"Crossref","is-referenced-by-count":2,"title":["Comprehension of Defect Pattern at Code Construction Phase during Software Development Process"],"prefix":"10.1007","author":[{"given":"Bhagavant","family":"Deshpande","sequence":"first","affiliation":[]},{"given":"Jawahar J.","family":"Rao","sequence":"additional","affiliation":[]},{"given":"V.","family":"Suma","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"73_CR1","unstructured":"Humphrey, W.: A Discipline for Software Engineering. Addison-Wesley Professional Publisher (1995) ISBN: 0201546108"},{"key":"73_CR2","unstructured":"Weinberg, G.M.: Quality Software Management: Systems Thinking. Dorset House Publisher (1997) ISBN-10: 0932633226, ISBN-13: 978-0932633224"},{"issue":"6","key":"73_CR3","doi-asserted-by":"publisher","first-page":"43","DOI":"10.1109\/MS.2002.1049386","volume":"19","author":"R. Chillarege","year":"2002","unstructured":"Chillarege, R.: The Marriage of Business Dynamics and Software Engineering. IEEE Software\u00a019(6), 43\u201349 (2002)","journal-title":"IEEE Software"},{"key":"73_CR4","unstructured":"Kan, S.H.: Metrics and Models in Software Quality Engineering, 2nd edn. Addison-Wesley Publisher, Boston (2003)"},{"key":"73_CR5","doi-asserted-by":"publisher","DOI":"10.1002\/0471722324","volume-title":"Software Quality Engineering: Testing, Quality Assurance and Quantifiable Improvement","author":"J. Tian","year":"2005","unstructured":"Tian, J.: Software Quality Engineering: Testing, Quality Assurance and Quantifiable Improvement. Wiley John & Sons Publisher, New Jersey (2005)"},{"key":"73_CR6","unstructured":"Walia, G.S., Carver, J.C.: A systematic Literature Review to Identify and Classify Software Requirement Errors, Technical Report MSU-071207"},{"key":"73_CR7","unstructured":"Soni, M.: Defect Prevention: Reducing Costs and Enhancing Quality, iSixSigma.com (July 19, 2006), \n http:\/\/software.isixsigma.com\/library\/content\/c060719b.asp"},{"issue":"3","key":"73_CR8","first-page":"241","volume":"3","author":"I.M. Iacob","year":"2008","unstructured":"Iacob, I.M., Constantinescu, R.: Testing- First Step towards software quality. Journal of Applied Quantitative Methods\u00a03(3), 241\u2013253 (2008)","journal-title":"Journal of Applied Quantitative Methods"},{"key":"73_CR9","doi-asserted-by":"crossref","unstructured":"Suma, V., Gopalakrishnan Nair, T.R.: Impact of Test Effort in Software Development Life Cycle for Effective Defect Management. International Journal of Productivity and Quality Management (IJPQM)\u00a013(3) (2014)","DOI":"10.1504\/IJPQM.2014.060417"},{"issue":"2","key":"73_CR10","first-page":"14","volume":"13","author":"T.R. Gopalakrishnan Nair","year":"2011","unstructured":"Gopalakrishnan Nair, T.R., Suma, V., Nair, N.G.: Estimation of Characteristics of a Software Team for Implementing Effective Inspection Process Inspection performance Metric. Software Quality Professional Journal, American Society for Quality (ASQ)\u00a013(2), 14\u201326 (2011)","journal-title":"Software Quality Professional Journal, American Society for Quality (ASQ)"},{"issue":"6","key":"73_CR11","first-page":"22","volume":"24","author":"T.R. Gopalakrishnan Nair","year":"2011","unstructured":"Gopalakrishnan Nair, T.R., Suma, V.: Defect Management Using Pair Metrics, DI and IPM. CrossTalk, The Journal of Defense Software Engineering\u00a024(6), 22\u201327 (2011)","journal-title":"CrossTalk, The Journal of Defense Software Engineering"},{"key":"73_CR12","unstructured":"Gopalakrishnan Nair, T.R., Suma, V.: Implementation of Depth of Inspection Metric and Inspection Performance Metric for Quality Management in Software Development Life Cycle. International Journal of Productivity and Quality Management, IJPQM (2011)"},{"issue":"6","key":"73_CR13","doi-asserted-by":"publisher","first-page":"524","DOI":"10.1049\/iet-sen.2011.0148","volume":"6","author":"T.R. Gopalakrishnan Nair","year":"2012","unstructured":"Gopalakrishnan Nair, T.R., Suma, V., Tiwari, P.: Significance of Depth of Inspection and Inspection Performance Metrics for Consistent Defect Management in Software Industry. IET Software\u00a06(6), 524\u2013535 (2012)","journal-title":"IET Software"},{"issue":"2","key":"73_CR14","first-page":"2","volume":"12","author":"T.R. Gopalakrishnan Nair","year":"2010","unstructured":"Gopalakrishnan Nair, T.R., Suma, V.: Impact Analysis of Inspection Process for Effective Defect Management in Software Development. American Society for Quality (ASQ) Journal\u00a012(2), 2\u201314 (2010)","journal-title":"American Society for Quality (ASQ) Journal"},{"issue":"1","key":"73_CR15","doi-asserted-by":"crossref","first-page":"71","DOI":"10.1504\/IJPQM.2010.033885","volume":"6","author":"V. Suma","year":"2010","unstructured":"Suma, V., Gopalakrishnan Nair, T.R.: Better Defect Detection and Prevention Through Improved Inspection and Testing Approach in Small and Medium Scale Software Industry. International Journal of Productivity and Quality Management (IJPQM)\u00a06(1), 71\u201390 (2010)","journal-title":"International Journal of Productivity and Quality Management (IJPQM)"},{"issue":"2","key":"73_CR16","first-page":"53","volume":"3","author":"T.R. Gopalakrishnan Nair","year":"2010","unstructured":"Gopalakrishnan Nair, T.R., Suma, V.: The Pattern of Software Defects Spanning across Size Complexity. International Journal of Software Engineering (IJSE)\u00a03(2), 53\u201370 (2010)","journal-title":"International Journal of Software Engineering (IJSE)"},{"issue":"3","key":"73_CR17","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/1764810.1764827","volume":"35","author":"T.R. Gopalakrishnan Nair","year":"2010","unstructured":"Gopalakrishnan Nair, T.R., Suma, V.: A Paradigm for Metric Based Inspection Process for Enhancing Defect Management. ACM SIGSOFT Software Engineering Notes\u00a035(3), 1 (2010)","journal-title":"ACM SIGSOFT Software Engineering Notes"},{"key":"73_CR18","unstructured":"Jones, C.: Measuring Defect Potentials and Defect Removal Efficiency. Crosstalk, The Journal of Defense Software Engineering\u00a021(6) (2008)"},{"issue":"7","key":"73_CR19","doi-asserted-by":"publisher","first-page":"774","DOI":"10.1016\/j.infsof.2006.09.002","volume":"49","author":"J. Jacobs","year":"2007","unstructured":"Jacobs, J., Moll, J.V., Kusters, R., Trienekens, J., Brombacher, A.: Identification of Factors that Influence Defect Injection and Detection in Development of Software Intensive Products. Information and Software Technology Journal\u00a049(7), 774\u2013789 (2007)","journal-title":"Information and Software Technology Journal"},{"key":"73_CR20","doi-asserted-by":"crossref","unstructured":"Karg, L.M., Beckhaus, A.: Modeling Software Quality Costs by Adapting Established Methodologies of Mature Industries. In: IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, December 2-5, pp. 267\u2013271 (2007)","DOI":"10.1109\/IEEM.2007.4419193"},{"key":"73_CR21","doi-asserted-by":"publisher","first-page":"4","DOI":"10.1147\/sj.331.0004","volume":"33","author":"S.H. Kan","year":"1994","unstructured":"Kan, S.H., Basili, V.R., Shapiro, L.N.: Software quality: An overview from the Perspective of Total Quality Management. IBM Systems Journal\u00a033, 4\u201319 (1994)","journal-title":"IBM Systems Journal"}],"container-title":["Advances in Intelligent Systems and Computing","Proceedings of the 3rd International Conference on Frontiers of Intelligent Computing: Theory and Applications (FICTA) 2014"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-319-12012-6_73","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,14]],"date-time":"2023-02-14T23:54:33Z","timestamp":1676418873000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-319-12012-6_73"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015]]},"ISBN":["9783319120119","9783319120126"],"references-count":21,"URL":"https:\/\/doi.org\/10.1007\/978-3-319-12012-6_73","relation":{},"ISSN":["2194-5357","2194-5365"],"issn-type":[{"type":"print","value":"2194-5357"},{"type":"electronic","value":"2194-5365"}],"subject":[],"published":{"date-parts":[[2015]]}}}