{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,12]],"date-time":"2024-09-12T01:50:00Z","timestamp":1726105800802},"publisher-location":"Cham","reference-count":15,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030638351"},{"type":"electronic","value":"9783030638368"}],"license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-3-030-63836-8_14","type":"book-chapter","created":{"date-parts":[[2020,11,18]],"date-time":"2020-11-18T09:12:07Z","timestamp":1605690727000},"page":"162-171","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Analysis on the Boltzmann Machine with Random Input Drifts in Activation Function"],"prefix":"10.1007","author":[{"given":"Wenhao","family":"Lu","sequence":"first","affiliation":[]},{"given":"Chi-Sing","family":"Leung","sequence":"additional","affiliation":[]},{"given":"John","family":"Sum","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2020,11,19]]},"reference":[{"issue":"1","key":"14_CR1","doi-asserted-by":"publisher","first-page":"147","DOI":"10.1207\/s15516709cog0901_7","volume":"9","author":"DH Ackley","year":"1985","unstructured":"Ackley, D.H., Hinton, G.E., Sejnowski, T.J.: A learning algorithm for Boltzmann machines. Cogn. Sci. 9(1), 147\u2013169 (1985)","journal-title":"Cogn. Sci."},{"key":"14_CR2","unstructured":"Hinton, G.E., Sejnowski, T.J., Ackley, D.H.: Boltzmann machines: constraint satisfaction networks that learn. Carnegie-Mellon University, Pittsburgh (1984)"},{"issue":"1","key":"14_CR3","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1016\/S0885-2308(86)80008-0","volume":"1","author":"RW Prager","year":"1986","unstructured":"Prager, R.W., Harrison, T.D., Fallside, F.: Boltzmann machines for speech recognition. Comput. Speech Lang. 1(1), 3\u201327 (1986)","journal-title":"Comput. Speech Lang."},{"key":"14_CR4","unstructured":"Ma, H.: Pattern recognition using Boltzmann machine. In: Proceedings IEEE Southeastcon 1995. Visualize the Future, pp. 23\u201329 (1995)"},{"key":"14_CR5","unstructured":"Tang, Y., Salakhutdinov, R., Hinton, G.: Robust Boltzmann machines for recognition and denoising. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 2264\u20132271 (2012)"},{"key":"14_CR6","unstructured":"Lee, P.: Low noise amplifier selection guide for optimal noise performance. In: Analog Devices Application Note AN-940 (2009)"},{"issue":"5","key":"14_CR7","doi-asserted-by":"publisher","first-page":"911","DOI":"10.1109\/TCSI.2009.2015207","volume":"56","author":"J He","year":"2009","unstructured":"He, J., Zhan, S., Chen, D., Geiger, R.L.: Analysis of static and dynamic random offset voltages in dynamic comparators. IEEE Trans. Circuits Syst. I Regul. Pap. 56(5), 911\u2013919 (2009)","journal-title":"IEEE Trans. Circuits Syst. I Regul. Pap."},{"issue":"20","key":"14_CR8","doi-asserted-by":"publisher","first-page":"1088","DOI":"10.1049\/el:20071017","volume":"43","author":"J-M Redoute","year":"2007","unstructured":"Redoute, J.-M., Steyaert, M.: Measurement of emi induced input offset voltage of an operational amplifier. Electronics Letters. 43(20), 1088\u20131090 (2007)","journal-title":"Electronics Letters."},{"issue":"8","key":"14_CR9","doi-asserted-by":"publisher","first-page":"3870","DOI":"10.1109\/TNNLS.2017.2731319","volume":"29","author":"H Wang","year":"2018","unstructured":"Wang, H., Feng, R., Han, Z.F., Leung, C.S.: ADMM-based algorithm for training fault tolerant RBF networks and selecting centers. IEEE Trans. Neural Netw. Learn. Syst. 29(8), 3870\u20133878 (2018)","journal-title":"IEEE Trans. Neural Netw. Learn. Syst."},{"issue":"6","key":"14_CR10","doi-asserted-by":"publisher","first-page":"1360","DOI":"10.1109\/TNNLS.2016.2536172","volume":"28","author":"CS Leung","year":"2017","unstructured":"Leung, C.S., Wan, W.Y., Feng, R.: A regularizer approach for RBF networks under the concurrent weight failure situation. IEEE Trans. Neural Netw. Learn. Syst. 28(6), 1360\u20131372 (2017)","journal-title":"IEEE Trans. Neural Netw. Learn. Syst."},{"issue":"4","key":"14_CR11","doi-asserted-by":"publisher","first-page":"863","DOI":"10.1109\/TNNLS.2015.2427331","volume":"27","author":"Y Xiao","year":"2016","unstructured":"Xiao, Y., Feng, R., Leung, C.S., Sum, J.: Objective function and learning algorithm for the general node fault situation. IEEE Trans. Neural Netw. Learn. Syst. 27(4), 863\u2013874 (2016)","journal-title":"IEEE Trans. Neural Netw. Learn. Syst."},{"issue":"3","key":"14_CR12","doi-asserted-by":"publisher","first-page":"153","DOI":"10.1049\/ip-vis:20030362","volume":"150","author":"H Chen","year":"2003","unstructured":"Chen, H., Murray, A.F.: Continuous restricted Boltzmann machine with an implementable training algorithm. IEE Proc. Vis. Image Signal Process. 150(3), 153\u2013158 (2003)","journal-title":"IEE Proc. Vis. Image Signal Process."},{"issue":"3","key":"14_CR13","doi-asserted-by":"publisher","first-page":"755","DOI":"10.1109\/TNN.2006.873278","volume":"17","author":"H Chen","year":"2006","unstructured":"Chen, H., Fleury, P.C.D., Murray, A.F.: Continuous-valued probabilistic behavior in a VLSI generative model. IEEE Trans. Neural Netw. Learn. Syst. 17(3), 755\u2013770 (2006)","journal-title":"IEEE Trans. Neural Netw. Learn. Syst."},{"issue":"10","key":"14_CR14","doi-asserted-by":"publisher","first-page":"3200","DOI":"10.1109\/TNNLS.2018.2889072","volume":"30","author":"J Sum","year":"2019","unstructured":"Sum, J., Leung, C.S.: Learning algorithm for Boltzmann machines with additive weight and bias noise. IEEE Trans. Neural Netw. Learn. Syst. 30(10), 3200\u20133204 (2019)","journal-title":"IEEE Trans. Neural Netw. Learn. Syst."},{"key":"14_CR15","unstructured":"Haley, D.C.: Estimation of the dosage mortality relationship when the dose is subject to error. Tech. rep. Applied Mathematics and Statistics Labs. Standford University (1952)"}],"container-title":["Lecture Notes in Computer Science","Neural Information Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-63836-8_14","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,12]],"date-time":"2024-03-12T13:29:45Z","timestamp":1710250185000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-63836-8_14"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"ISBN":["9783030638351","9783030638368"],"references-count":15,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-63836-8_14","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2020]]},"assertion":[{"value":"19 November 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICONIP","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Neural Information Processing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Bangkok","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Thailand","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2020","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18 November 2020","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"22 November 2020","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"27","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iconip2020","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.apnns.org\/ICONIP2020","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"618","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"187","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"189","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"30% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.18","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.68","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Due to COVID-19 pandemic the conference was held virtually.","order":10,"name":"additional_info_on_review_process","label":"Additional Info on Review Process","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}