{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T22:49:13Z","timestamp":1725662953945},"publisher-location":"Berlin, Heidelberg","reference-count":10,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540074106"},{"type":"electronic","value":"9783540379294"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1975]]},"DOI":"10.1007\/3-540-07410-4_657","type":"book-chapter","created":{"date-parts":[[2012,2,25]],"date-time":"2012-02-25T10:59:40Z","timestamp":1330167580000},"page":"534-544","source":"Crossref","is-referenced-by-count":0,"title":["Universelle Klassen O(log(MxN))-testbarer iterativer und sequentieller Schaltungen"],"prefix":"10.1007","author":[{"given":"Wolfgang","family":"Coy","sequence":"first","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2005,6,4]]},"reference":[{"doi-asserted-by":"crossref","unstructured":"G. Hotz, Schaltkreistheorie, Berlin, 1974.","key":"41_CR1","DOI":"10.1515\/9783111343716"},{"unstructured":"A.D. Friedman\/P.R. Menon, Fault Detection in Digital Systems, Englewood Cliffs, 1971.","key":"41_CR2"},{"unstructured":"W. G\u00f6rke, Fehlerdiagnose digitaler Schaltungen, Stuttgart, 1973.","key":"41_CR3"},{"unstructured":"W. Coy, On the realization of arbitrary switching functions with a linear number of tests, in J. Rosenfeld (Hrsg.), Information Processing 74, Amsterdam, 1974.","key":"41_CR4"},{"unstructured":"W. Coy, Zur Konstruktion einfach testbarer Schaltkreise, (erscheint in Elektronische Informationsverarbeitung und Kybernetik).","key":"41_CR5"},{"key":"41_CR6","doi-asserted-by":"crossref","first-page":"1061","DOI":"10.1109\/T-C.1973.223651","volume":"C-22","author":"A.D. Friedman","year":"1973","unstructured":"A.D. Friedman, Easily testable iterative systems, IEEE Trans. Comp., Vol. C-22, pp. 1061\u20131064, Dez. 1973.","journal-title":"IEEE Trans. Comp."},{"key":"41_CR7","doi-asserted-by":"crossref","first-page":"1183","DOI":"10.1109\/T-C.1972.223475","volume":"C-21","author":"R.W. Landgraff","year":"1972","unstructured":"R.W. Landgraff\/ S.S. Yau, Design of diagnosable iterative arrays, IEEE Trans. Comp., Vol. C-21, pp. 1183\u20131188, Nov. 1972.","journal-title":"IEEE Trans. Comp."},{"key":"41_CR8","doi-asserted-by":"crossref","first-page":"509","DOI":"10.1109\/TCOME.1964.6539498","volume":"83","author":"J.M. Galey","year":"1964","unstructured":"J.M. Galey\/R.E. Norby\/J.P. Roth, Techniques for the diagnosis of switching circuit failures, IEEE Trans. Comm. Elec., Vol. 83, pp. 509\u2013514, Sept. 1964.","journal-title":"IEEE Trans. Comm. Elec."},{"volume-title":"Testkomplexit\u00e4t als Entwurfskriterium, Berichte der Informatik-Forschungsgruppen Nr. AFS-16","year":"1975","author":"W. Coy","unstructured":"W. Coy, Testkomplexit\u00e4t als Entwurfskriterium, Berichte der Informatik-Forschungsgruppen Nr. AFS-16, Technische Hochschule Darmstadt, Darmstadt, 1975.","key":"41_CR9"},{"issue":"9","key":"41_CR10","doi-asserted-by":"crossref","first-page":"835","DOI":"10.1109\/TC.1973.5009174","volume":"C-22","author":"S.B. Akers","year":"1973","unstructured":"S.B. Akers, Universal test sets for logic networks, IEEE Trans. Comp. Vol. C-22, No. 9, pp. 835\u2013839, Sept. 1973.","journal-title":"IEEE Trans. Comp."}],"container-title":["Lecture Notes in Computer Science","GI \u2014 5. Jahrestagung"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/3-540-07410-4_657.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,11,17]],"date-time":"2020-11-17T14:57:44Z","timestamp":1605625064000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/3-540-07410-4_657"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1975]]},"ISBN":["9783540074106","9783540379294"],"references-count":10,"URL":"https:\/\/doi.org\/10.1007\/3-540-07410-4_657","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[1975]]}}}